Delay-Line Analog Memory for High-Precision Signal Timing
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Solution Overview
Problem
High-precision time-measuring devices face limitations due to reaction time dependencies on signal shape and amplitude, and resolution is constrained by microelectronic technology and noise in existing signal measurement systems, leading to suboptimal precision and complex calibration requirements.
Innovation Solution
A time-measuring device incorporating a delay line associated with a sampler and analog memory, where each delay element's output is connected to a memory cell for sequential sampling and storage of the input signal, allowing for improved precision through digital processing of analog data and reduced critical elements in the measurement chain.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a discriminator is used to convert the input signal into a binary pulse, then the time measurement can be performed, but the discriminator has a reaction time that depends on the shape and amplitude of the input signal, reducing measurement precision
Solution Approach 1:
The patent replaces the traditional discriminator-based time measurement mechanism with an analog memory system that stores voltage samples corresponding to different time positions. Instead of using a discriminator to generate binary pulses that are subject to reaction time variations, the system directly samples and stores the analog signal waveform, allowing precise time determination through digital processing of the stored voltage values without being affected by discriminator reaction time dependencies on signal shape and amplitude.
2Measurement precision
If a delay line is used for fine time measurement, then the time resolution can be improved, but the resolution is limited to the first order by the microelectronic technology chosen for the corresponding circuit
Solution Approach 1:
The patent replaces the delay line mechanism with an analog memory system that stores voltage samples at different time positions. Instead of relying on physical delay elements whose resolution is limited by microelectronic technology, the system uses digital storage and processing of analog samples, allowing time resolution to be determined by the sampling rate and digital processing capabilities rather than being constrained by delay line fabrication technology.
Solution Approach 2:
The patent transitions from a one-dimensional time measurement approach using delay lines to a two-dimensional approach by storing both time position and voltage amplitude in an analog memory array. This allows precise time determination through digital interpolation of voltage values across multiple time samples, effectively adding an amplitude dimension to the time measurement process and achieving resolution beyond what traditional delay lines can provide.
3Measurement precision
If interpolation between several delay lines is used to improve precision, then significant gain in precision is achieved, but the complexity of operation and practical realization increases
Solution Approach 1:
The patent extracts the time measurement function from the complex multi-delay line interpolation system and implements it using a single analog memory system that stores voltage samples across multiple time positions. By removing the need for multiple physical delay lines and their associated interpolation logic, the system achieves similar or superior precision while dramatically reducing operational and practical realization complexity.
4Measurement precision
If interpolation between several delay lines is used to improve precision, then significant gain in precision is achieved, but the surface area and consumption increase due to additional delay lines
Solution Approach 1:
The patent merges the functions of multiple delay lines into a single analog memory structure that stores voltage samples corresponding to different time positions. Instead of requiring separate physical delay lines for each time position, the system uses a unified memory array where each address stores a voltage sample, achieving the same time measurement capability with significantly reduced surface area and lower power consumption.
5Measurement precision
If a time-amplitude converter with voltage ramp generator is used, then the fine dating pitch depends only on the slope of the ramp and ADC pitch, but the resolution is limited by noise on the ramp, its linearity and precision of starting and stopping
Solution Approach 1:
The patent creates a digital copy of the analog signal waveform by storing voltage samples in an analog memory system. Instead of using a voltage ramp generator that is susceptible to noise and linearity errors, the system directly samples and stores the actual signal waveform at different time positions, allowing precise time determination through digital processing of the copied voltage values without being affected by ramp generation imperfections.
Data Source
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AI summary
The invention relates to a device comprising a binary pulse input signal converting means (3, 4), the output of which is connected to a means forming a counter (6) and to a means forming a delay line (7) that comprises a plurality of delay elements, the means forming a counter (6) and the means forming a delay line (7) also receiving a clock signal (8) as an input, characterized in that the means forming a delay line (7) is combined with a means forming a sampler and analog memory (9) comprising a plurality of storage cells that receive the input signal (1) as input, and in that each element of the means forming a delay line (7) has an output connected to a corresponding storage cell of the means forming analog memory (9) so as to sequentially control the sampling and storage of the input signal (1) in the latter.