Edge-Triggered Delay Measurement With Feedback Delay Tuning

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Solution Overview

Problem

Accurately measuring the delay or latency in electronic devices that switch between logic states is challenging due to the difficulty in comparing and adjusting the delay times between different signals, leading to measurement errors and reduced accuracy.

Innovation Solution

A delay measurement system comprising a device under test (DUT), a delay control device, a comparator, and a controller, which uses edge-triggered comparisons and tunings to adjust the delay times, allowing for precise approximation of delay times through coarse and fine tuning mechanisms, thereby minimizing measurement errors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional delay measurement methods are used, then the measurement process is simple, but the measurement precision is poor due to difficulty in comparing and adjusting delay times between different signals

Engineering Contradiction:
Improvedelay time measurement accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces a delay control device as an intermediary component that generates a reference signal with adjustable delay time. This mediator enables precise comparison between the DUT output signal and a controllable reference signal, solving the measurement accuracy problem while maintaining manageable system complexity through modular design

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent implements a feedback mechanism where the comparator output is fed back to the delay control device. This feedback loop allows automatic adjustment of the reference signal delay time to match the DUT delay time, enabling precise measurement through iterative comparison and eliminating the need for complex manual calibration

Inventive Principle:
Principle #23Feedback

2Productivity

If delay times are adjusted manually for comparison, then the system is easier to operate, but the measurement speed is slow and accuracy is reduced

Engineering Contradiction:
Improvemeasurement speedVSAvoidsystem operation simplicity
Core Design Contradiction:
ProductivityVSEase of operation

Solution Approach 1:

The patent enables the measurement system to perform self-adjustment through the feedback mechanism. The delay control device automatically adjusts the reference signal delay time based on comparator feedback without requiring manual intervention, thereby increasing measurement speed while maintaining ease of operation through automated control

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces manual mechanical adjustment mechanisms with electronic control. The delay control device uses electronic signals to adjust delay time automatically based on comparator feedback, substituting manual mechanical operations with automated electronic control to improve measurement speed

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS12169222B2Delay measurement system and measurement method
Publication Date: 2024.12.17 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12169222B2 patent drawing
  • US12169222B2 patent drawing
  • US12169222B2 patent drawing

AI summary

A delay measurement system and a measurement method are provided. The delay measurement system includes a delay control device and a comparator. The delay control device is configured to generate a second signal in response to a first signal, wherein a rising edge of the second signal delays a first delay time with respect to a rising edge of the first signal, and the first delay time is controlled in response to an output signal of a comparator. The comparator is configured to compare the first delay time with a second delay time and output the output signal, wherein a rising edge of a third signal delays the second delay time with respect to the rising edge of the first signal, and the third signal is generated by a device under test (DUT) in response to the first signal.