Demura Image Acquisition Accuracy Evaluation Using Test Point Patterns
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Solution Overview
Problem
Existing Demura devices lack accurate methods to evaluate image acquisition accuracy, leading to inconsistent Demura compensation effects due to varying image processing qualities among different manufacturers, which are currently judged subjectively by human observation.
Innovation Solution
A method and apparatus for evaluating Demura device image acquisition accuracy by controlling a display panel to display test patterns, acquiring preprocessed images, and determining positional differences between test points using low-pass filtering, binarization, and calculating offset distances and standard deviations to objectively assess image alignment accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If subjective human observation is used to judge image processing quality, then the evaluation process is simple and quick, but the measurement precision and reliability are insufficient leading to inconsistent Demura compensation effects
Solution Approach 1:
The patent replaces subjective human observation with an automated image processing system that uses computer vision algorithms. The system automatically detects test point patterns, calculates positional deviations, and evaluates image acquisition accuracy through computational methods, eliminating human subjectivity while maintaining high measurement precision.
Solution Approach 2:
The patent introduces an intermediary evaluation system that includes test point patterns, image processing algorithms, and deviation calculation modules. This intermediary system objectively measures the relationship between original and processed images, providing precise quantitative data about image acquisition accuracy without direct human judgment.
2Ease of manufacture
If traditional checkerboard patterns are used for positioning, then the pattern is simple and easy to generate, but the positioning accuracy is insufficient and cannot meet the needs of sub-pixel positioning in OLED
Solution Approach 1:
The patent modifies the traditional checkerboard pattern by adding specific test point patterns at critical locations. These test points are strategically positioned to evaluate different aspects of image quality including focus, distortion, and sub-pixel alignment. The localized addition of test points provides targeted measurement capabilities without complicating the overall pattern generation process.
Solution Approach 2:
The patent segments the evaluation task by dividing the image into multiple test regions with specific test point patterns. Each region evaluates different aspects of image acquisition quality, allowing the system to independently analyze and assess various parameters such as focus accuracy, distortion characteristics, and sub-pixel positioning at different locations across the display panel.
Data Source
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Figure 3~3A
AI summary
The present disclosure provides a method for evaluating an image acquisition accuracy of a Demura device, including: controlling a display panel to display a detection picture, wherein the detection picture includes a plurality of test point patterns with an interval therebetween; acquiring an image of the detection picture by the Demura device to obtain a preprocessed image corresponding to the detection picture, wherein the preprocessed image and a corresponding detection picture have a same size and a same shape; and determining the image acquisition accuracy of the Demura device according to a difference between a position of each of the plurality of test point patterns in the detection picture and a corresponding position of the test point pattern in the preprocessed image. The present disclosure also provides an apparatus for evaluating an image acquisition accuracy of a Demura device, an electronic device and a non-transitory computer-readable storage medium.