Derived Measurement Surface for Additive Manufacturing Quality Control
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Solution Overview
Problem
Additive manufacturing processes face challenges in accurately measuring objects with surface deviations such as surface deformations and roughness, which can lead to inaccuracies in quality control and calibration, especially when noise is present in scan data.
Innovation Solution
A method involving statistical analysis of measured surface data to determine a virtual measurement surface, accounting for surface deviations and noise, by aligning with reference surfaces and using a kth percentile approach to define the measurement surface, allowing for robust measurements that improve process control and calibration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If direct measurement of the measured surface is performed, then measurement process is simple, but measurement precision deteriorates due to surface deviations and noise
Solution Approach 1:
The patent introduces a derived measurement surface as an intermediary between the noisy measured surface and the final measurement evaluation. This derived surface acts as a mediator that filters out surface deviations and noise while preserving the essential geometric information needed for accurate measurements, thereby improving measurement precision without requiring complex measurement hardware
Solution Approach 2:
The patent performs preliminary processing to generate the derived measurement surface before conducting the final measurement evaluation. By pre-processing the scan data to create a cleaned, representative surface model, the system eliminates noise and surface deviations in advance, allowing for more accurate subsequent measurements without adding complexity to the measurement process itself
2Measurement precision
If statistical analysis is performed to account for surface deviations, then measurement precision improves, but calculation time increases
Solution Approach 1:
The patent extracts only the essential geometric features from the noisy scan data to create the derived measurement surface, rather than performing exhaustive statistical analysis on all data points. By selecting and processing only the critical information needed for accurate measurements, the system achieves high measurement precision while minimizing calculation time
Solution Approach 2:
The patent applies different processing approaches to different regions of the object surface based on their specific characteristics. By focusing statistical analysis and processing efforts on critical measurement areas rather than uniformly processing the entire surface, the system achieves high measurement precision in key regions while reducing overall calculation time
Data Source
AI summary
A method of making a measurement relating to an object manufactured according to a model may be provided. The object may have a measured surface comprising a surface deviation relative to a corresponding surface of the model. The method may comprise obtaining measured surface data representing at least a portion of the measured surface comprising the said surface deviation. The method may comprise determining a measurement surface corresponding to the measured surface of the object by performing a statistical analysis of at least a portion of the measured surface data in respect of an interpretation direction such that a portion of the measured surface data is offset from the measurement surface in the interpretation direction. The method may comprise making a measurement relating to the object depending on the measurement surface.