Detachable Jumper for Flexible IC Pin Testing
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Solution Overview
Problem
The high cost and low flexibility of manufacturing dedicated circuit boards for each IC chip to test their electrical functions at the packaging stage, due to varying circuit characteristics and pin arrangements, lead to inefficiencies in electrical testing.
Innovation Solution
A test apparatus comprising a base board with slots for IC pins and a jumper with gold-based circuits that can be detachably inserted to connect IC pins to a tester, allowing for flexible pin arrangement matching without the need for multiple circuit boards.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a dedicated circuit board is manufactured for each IC chip to ensure correct electrical connection, then electrical testing reliability is improved, but manufacturing cost increases and flexibility of use decreases
Solution Approach 1:
The circuit board is segmented into a base board with fixed slots and detachable jumpers. The base board contains the tester connection interface and slot structure, while the jumpers contain the configurable circuit traces. This segmentation allows the expensive base board to be reused across different IC chip types, reducing manufacturing costs while maintaining reliable electrical connections through the precise slot-jumper interface.
Solution Approach 2:
The base board is designed with universal functionality to support multiple IC chip types through detachable jumpers. The base board's slot structure and tester interface remain unchanged, while different jumpers can be attached to accommodate various pin arrangements. This multi-functionality eliminates the need to manufacture separate dedicated circuit boards for each IC chip type, significantly reducing costs while maintaining testing reliability.
2Manufacturing precision
If a dedicated circuit board is manufactured for each IC chip, then electrical connection accuracy is improved, but flexibility of use deteriorates
Solution Approach 1:
The circuit board configuration is made dynamic through the detachable jumper design. Instead of a fixed dedicated circuit board, the system allows dynamic reconfiguration by attaching different jumpers to the base board's slot. This dynamic adaptability maintains precise electrical connections through the mechanical slot-jumper interface while enabling flexibility to accommodate different IC chip types and pin arrangements without manufacturing new boards.
Solution Approach 2:
The jumper acts as an intermediary component between the base board and the IC chip under test. The jumper contains the configurable circuit traces that adapt to different pin arrangements, while the base board provides the stable tester interface and slot mechanism. This intermediary design maintains connection accuracy through the precise mechanical interface while providing flexibility in configuring different electrical connection patterns.
3Adaptability or versatility
If multiple dedicated circuit boards are manufactured for different IC chip types, then testing capability for various chips is improved, but device complexity increases
Solution Approach 1:
The testing system is segmented into a permanent base board and interchangeable jumpers. The base board contains the fixed tester interface and slot structure, while the jumpers contain the variable circuit configurations. This segmentation reduces device complexity by eliminating the need to manage multiple complete circuit board designs, as only the simple jumper components need to be stored and swapped for different testing requirements.
Solution Approach 2:
The base board is designed as a universal platform that can support multiple IC chip types through detachable jumpers. This multi-functionality consolidates what would otherwise require multiple separate testing systems into a single base board with interchangeable accessories, significantly reducing device complexity while maintaining comprehensive testing capability across different chip types.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution reduces manufacturing costs and improves electrical conduction efficiency by using gold-based circuits that match different IC pin arrangements to tester pins, enabling efficient electrical testing without the need for custom circuit boards.
Implementation Method 1
The jumper includes a body and a plurality of first circuits. The first circuits are disposed on the body and electrically connect the electrical contacts of the first slot to a plurality of pins of a tester.
Data Source
AI summary
The present disclosure provides a test apparatus and a jumper thereof. The test apparatus includes a base board and the jumper. The base board has a first slot and a second slot. The first slot has a plurality of electrical contacts, and is configured to receive a plurality of pins of a device under test. The jumper is inserted into the second slot. The jumper includes a body and a plurality of first circuits. The first circuits are disposed on the body and electrically connect the electrical contacts of the first slot to a plurality of pins of a tester.