Detachable Latch Block for Semiconductor Test Handler Insert
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Solution Overview
Problem
Conventional test handlers face issues with resource wastage and operational inefficiency due to the need for replacing entire carrier boards and inserts when semiconductor devices of different sizes are tested, as existing latch units and mechanisms are not adaptable and often damage during reuse attempts.
Innovation Solution
The development of a detachable latch block module and a hook mechanism that can be easily coupled to the insert body, allowing for the reuse of inserts and latch units, even when semiconductor devices of varying sizes are tested, by using a coupling mechanism that prevents separation and allows for easy replacement and standardization across different insert bodies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If latch units and elements for operating latch are separated into parts and installed to the insert, then the latch mechanism can be assembled, but the parts may be damaged during disassembling and reassembling processes and the replacement time is increased
Solution Approach 1:
The latch mechanism is divided into modular components: the insert body with integrated latch, the operating member, and the carrier board. This segmentation allows the latch to be pre-assembled as a reliable unit while enabling easy replacement of the entire insert assembly without damaging individual parts.
Solution Approach 2:
The latch unit and the insert body are merged into a single integrated component, eliminating the need for separate assembly and disassembly of latch parts. The operating member remains separable, combining the reliability of integrated latch structures with the ease of operation of separate control elements.
2Adaptability or versatility
If the inserts are replaced when semiconductor devices of different sizes are tested, then the placing compartments can be suited to the replaced semiconductor devices, but resources included in the replaced inserts are wasted
Solution Approach 1:
The carrier board is segmented from the insert body, allowing the insert to remain on the carrier board while only the operating member or specific latch components are replaced. This enables adaptation to different semiconductor sizes without replacing the entire insert assembly, reducing resource wastage.
Solution Approach 2:
The insert body is designed with universal compatibility to work with semiconductor devices of different sizes through standardized carrier board interfaces. The adaptability is achieved by replacing only the operating member or adjusting the latch position, rather than replacing the entire insert, thus maintaining resource efficiency.
3Ease of repair
If the latch and elements for operating latch are installed to the frame separately from the insert body, then they can be reused after the insert body has been replaced, but the latch and operating member cannot hold small sized semiconductor devices when replaced with small sized devices
Solution Approach 1:
The latch mechanism is segmented such that the insert body with integrated latch remains on the carrier board for reuse, while only the operating member is replaced or adjusted to accommodate different semiconductor sizes. This maintains both reusability and adaptability.
Solution Approach 2:
The operating member is designed to be dynamically adjustable or replaceable to accommodate different semiconductor sizes, while the main latch structure remains fixed and reusable. This dynamic element provides versatility without sacrificing the reusability of the core latch mechanism.
Data Source
AI summary
An insert for a carrier board of a test handler is disclosed. In a first aspect, the latch block applying to the insert is detachably coupled to the insert body. The latch block can be reused, and thus this reduces wastage of resources and eliminates the insert replacement fee. In a second aspect, the insert pocket having hooks is detachably coupled to the insert body. The insert body can be reused. The latch unit is installed to the insert pocket, so that the damaged latch unit can be easily replaced. The insert forms a plurality of holes in the bottom of the loading part thereof, to expose the leads of the semiconductor devices through the holes downwardly. Thus, the insert can load semiconductor devices regardless of the dimensions of the semiconductor devices.