Detachable Probe Card Interface With Deformable Connector
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Solution Overview
Problem
Probe cards used for testing integrated circuit devices face challenges in replacing components due to the difficulty of detaching and reattaching the space transformer without desoldering, which is a time-consuming and costly process, especially under stress from repeated testing.
Innovation Solution
A detachable probe card interface using a deformable connector with conductive particles and an elastic shield that allows for solderless attachment and detachment by applying external forces, enabling quick and easy replacement of components without the need for soldering or desoldering.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If soldering is used to connect the space transformer to the PCB, then a stable and secure electrical connection is achieved, but the difficulty of detachment and replacement increases
Solution Approach 1:
The probe card is divided into separable modules: the PCB, the space transformer, and the probe head. Each module can be independently replaced without affecting the others, enabling easy maintenance while maintaining stable electrical connections through the deformable connector system.
Solution Approach 2:
The deformable connector transitions from a static soldered joint to a dynamic mechanical connection that can be easily assembled and disassembled. The elastic shield and conductive particles work together to provide a reusable electrical interface that maintains reliability while enabling component replacement.
2Reliability
If soldering is used to attach the space transformer, then a secure electrical connection is achieved, but the time required for maintenance and replacement increases
Solution Approach 1:
The mechanical deformation process of the elastic shield and conductive particles replaces the thermal soldering process. This mechanical connection system eliminates the need for soldering tools, flux, and heating processes, significantly reducing maintenance time while achieving equivalent electrical connection stability.
Solution Approach 2:
The connection mechanism changes from a thermal-chemical process (soldering) to a mechanical-deformation process. The elastic shield deforms under compression to create electrical contact through conductive particles, providing a faster, tool-free assembly and disassembly process that reduces maintenance time without sacrificing connection reliability.
3Ease of repair
If the probe card components are made interchangeable and detachable, then the ease of replacement improves, but the complexity of the connection mechanism increases
Solution Approach 1:
The elastic shield and conductive particles are merged into a single deformable connector assembly that performs both mechanical attachment and electrical connection functions. This integration simplifies the overall system by eliminating the need for separate fastening and electrical connection mechanisms.
Solution Approach 2:
The deformable connector serves multiple functions simultaneously: it provides mechanical attachment, establishes electrical connections, and enables easy detachment. This multi-functionality reduces the need for additional components and simplifies the overall connection mechanism while maintaining component interchangeability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for interchangeable and replaceable probe card components, reducing maintenance time and costs by enabling secure and stable electrical connections without the need for soldering, thus improving the reliability and efficiency of probe card assemblies.
Implementation Method 1
a deformable connector to electrically couple the space transformer to the circuit board. The deformable connector may include an elastic shield and a plurality of conductive particles disposed within the elastic shield. The elastic shield may deform when one or more forces are applied between the space transformer and the circuit board.
Implementation Method 2
the conductive particles may be configured to compress with one another to form electrical connections between electrical contacts on the space transformer and corresponding electrical traces on the circuit board when the one or more force are applied
Data Source
AI summary
A detachable probe card interface comprises a space transformer, a deformable connector, and a carrier board. The space transformer includes first electrical contacts and second electrical contacts, wherein the first electrical contacts are coupled to the second electrical contacts through one or more layers of the space transformer. The deformable connector includes a plurality of conductive particles arranged in columns coinciding with the second electrical contacts, wherein the conductive particles compress with one another when one or more forces are exerted on the deformable connector. The carrier board includes a plurality of vias aligned with the plurality of second electrical contacts on the space transformer, and a plurality of conductors disposed within the vias. Each of the conductors is coupled to a respective one of the second electrical contacts and protrudes into the deformable connector to establish a transmission path between the second electrical contact and one or more columns of the conductive particles.