Detecting Circuit Multiplexing for Narrow Bezel AMOLED Panels
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Solution Overview
Problem
Existing detecting circuits in AMOLED panels occupy excessive space, hindering the design of narrow bezel panels and increasing production costs.
Innovation Solution
A detecting circuit design that integrates a cell test circuit and array test circuit using multiple field-effect transistors and metal-oxide semiconductor transistors, allowing for shared space utilization and efficient operation, enabling the production of narrow bezel panels at reduced costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate detecting circuits are used for array test and cell test, then testing coverage is improved, but space occupancy increases
Solution Approach 1:
The patent combines array test circuit and cell test circuit into a single integrated detecting circuit. The circuit uses switching elements to multiplex test signal lines, allowing both array testing and cell testing to share common data lines and control lines. This merging reduces the total number of dedicated signal lines and decreases space occupancy while maintaining the ability to perform both types of tests.
Solution Approach 2:
The detecting circuit is designed with multi-functional capabilities where the same circuit components and signal lines can serve both array test and cell test functions. By using controllable switches and multiplexing techniques, the circuit dynamically reconfigures to perform different testing operations, achieving universality without requiring separate dedicated circuits for each test type.
2Productivity
If more detecting circuits are added to the panel, then production monitoring capability is improved, but production cost increases
Solution Approach 1:
The patent merges array test functionality and cell test functionality into a single detecting circuit implementation. By sharing common infrastructure such as data lines, control lines, and switching elements between the two test types, the total component count is reduced. This consolidation decreases manufacturing complexity and production cost while preserving comprehensive production monitoring capability across both array and cell processes.
3Reliability
If detecting circuits occupy large space, then testing functionality is maintained, but narrow bezel design becomes difficult
Solution Approach 1:
The patent employs signal line multiplexing and time-division multiplexing techniques that effectively reduce the spatial footprint of the detecting circuit. By allowing signal lines to serve multiple functions at different time intervals and using switching elements to route signals dynamically, the circuit achieves comprehensive testing functionality with minimized area occupation, thereby enabling narrow bezel panel designs.
Data Source
AI summary
The present disclosure proposes a detecting circuit and a display device. The detecting circuit includes a cell test circuit controlling signal line, a cell test circuit data signal line, an array test driving unit and an FET. The cell test circuit controlling signal line is connected to a gate of the FET. The cell test circuit controlling signal line is connected to a drain of the FET. A common signal is further connected to a source of the FET. By using the detecting circuit, a panel with a narrow bezel and low production cost can be realized.