Particle Beam Detector Array With Vertical Offset Pins
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Solution Overview
Problem
In particle beam detector arrays, electron recombination within the ionization chamber limits the strength and accuracy of detected signals, and increasing the potential difference between the cathode and anode planes can lead to electrical breakdown or gas multiplication, while a larger distance between the planes increases recombination and reduces the electric field strength.
Innovation Solution
The introduction of conductive elongated pins extending from both the anode and cathode planes into the sensitive region, which are electrically coupled to conductive sensor pads and strips, enhances the electric field strength and reduces electron travel distance, thereby limiting recombination without increasing the potential difference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the potential difference between the cathode and anode planes is increased to reduce electron recombination, then the electric field strength increases and recombination decreases, but electrical breakdown or gas multiplication occurs
Solution Approach 1:
The patent divides the sensitive region into multiple smaller regions by introducing conductive pins that create localized collection points. This segmentation allows the electric field to be concentrated in specific zones rather than requiring a uniformly high potential difference across the entire chamber, thus reducing recombination locally without causing overall electrical breakdown.
Solution Approach 2:
The conductive pins act as intermediaries between the cathode and anode planes. These pins extend into the sensitive region and provide intermediate charge collection points, effectively reducing the distance electrons must travel through the gas. This intermediary structure allows for efficient charge collection at lower potential differences, preventing electrical breakdown while maintaining detection accuracy.
2Reliability
If the distance between the cathode and anode planes is increased to reduce recombination, then the electron travel distance increases and recombination decreases, but the electric field strength decreases
Solution Approach 1:
The patent transitions from a two-plane geometry to a three-dimensional structure by introducing vertical pins that extend into the sensitive region. This dimensional change creates multiple charge collection points at different heights, effectively reducing the electron collection path length in the vertical dimension while maintaining a larger horizontal separation between cathode and anode planes, thus preserving electric field strength.
Solution Approach 2:
The conductive pins serve as intermediary charge collection structures that bridge the gap between the cathode and anode planes. By providing intermediate collection points within the sensitive region, these pins reduce the effective electron travel distance without requiring the cathode and anode planes to be closer together, thereby maintaining electric field strength while reducing recombination.
3Force
If the distance between the cathode and anode planes is decreased to increase electric field strength, then the electric field strength increases and recombination decreases, but the electron travel distance decreases and recombination increases
Solution Approach 1:
The patent segments the charge collection function by introducing multiple conductive pins distributed throughout the sensitive region. This segmentation allows the system to maintain a larger distance between cathode and anode planes for safety, while the pins create localized regions of strong electric field that efficiently collect electrons before they can recombine, thus maintaining detection accuracy without requiring plane proximity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration improves ionization charge collection, increases the accuracy and precision of particle beam detection, and allows the detector array to reach saturation conditions at a lower potential difference, maintaining a stronger electric field and reducing recombination.
Implementation Method 1
The cathode plane and the anode plane are configured to create an electric field within the sensitive region by applying differing electric potentials
Implementation Method 2
a first plurality of conductive elongated pins extending away from the sensor pads into the sensitive region, wherein each pin of the plurality of pins is electrically coupled to one of the conductive sensor pads
Data Source
AI summary
A particle beam detector array with a cathode plane offset from an anode plane and a sensitive region between the cathode plane and the anode plane. The cathode plane and the anode plane are configured to create an electric field within the sensitive region. The anode plane has sensor pads configured to conduct electric current based on the fluence and position of an incident particle beam. A first plurality of conductive pins extends away from the sensor pads into the sensitive region. Each pin of the first plurality of pins is electrically coupled to one of the sensor pads. The sensor pads may be coupled to a series of strips with at least two layers, where each layer is associated with a different axis of at least two axes. A second plurality of pins may be electrically coupled to and extend away from the cathode plane into the sensitive region.