Radiation Detector Oblique X-ray Correction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional X-ray computed tomography (CT) systems face challenges in maintaining high image quality due to oblique incidence of X-rays, which affects spatial resolution and image quality, particularly in direct conversion X-ray detectors with smaller absorption areas and thicker semiconductor crystals, and X-ray flat panel detectors where all elements are arranged on a large surface, leading to deteriorated image quality in both cone and fan angles.
Innovation Solution
A radiation diagnostic apparatus with plural radiation detection elements arranged in a two-dimensional direction, where the processing circuitry determines an output corresponding to a reconstruction position based on first and second outputs from adjacent detection elements, using weights calculated from the angles of incidence and material properties to correct for oblique X-ray incidence, thereby improving image quality by reducing the influence of oblique incidence.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If direct conversion X-ray detector with thicker semiconductor crystal is used to increase X-ray absorption area, then X-ray absorption capability is improved, but the distance of X-ray path becomes longer and the detector becomes more affected by oblique incidence
Solution Approach 1:
The patent replaces physical geometric correction (mechanical arrangement of detectors) with computational correction methods. By using processing circuitry to calculate and apply correction values based on incident angles and detection positions, the system achieves spatial resolution improvement without changing the physical detector structure or thickness.
Solution Approach 2:
The patent changes the parameter of detection position from fixed geometric position to corrected position based on incident angle calculations. The processing circuitry dynamically adjusts the effective detection position by applying correction values that account for oblique incidence, thereby maintaining spatial resolution across varying angles without physical repositioning.
2Area of stationary object
If X-ray conversion elements are arranged on a large surface area to cover wide field of view, then detection coverage is improved, but oblique incidence affects both column and channel directions deteriorating image quality
Solution Approach 1:
The patent applies different correction values to different detection elements based on their specific positions and incident angles. Each detection element receives a customized correction that accounts for its local geometric relationship with the X-ray source, enabling the large-area detector to maintain uniform image quality across all regions despite varying oblique incidence angles.
Solution Approach 2:
The patent replaces physical geometric correction (mechanical arrangement of detectors) with computational correction methods. By using processing circuitry to calculate and apply correction values based on incident angles and detection positions, the system achieves spatial resolution improvement without changing the physical detector structure or thickness.
3Manufacturing precision
If small module units with locally directed surfaces are used to reduce oblique incidence effect, then spatial resolution is improved, but scattered radiation from module structure deteriorates image quality
Solution Approach 1:
The patent replaces physical geometric correction (mechanical arrangement of detectors) with computational correction methods. By using processing circuitry to calculate and apply correction values based on incident angles and detection positions, the system achieves spatial resolution improvement without changing the physical detector structure or thickness.
4Measurement precision
If photon counting detector with energy bin projection is used for spectral imaging, then energy resolution is improved, but misalignment of detection position varies by energy bin due to oblique incidence
Solution Approach 1:
The patent applies different correction values to different detection elements based on their specific positions and incident angles. Each detection element receives a customized correction that accounts for its local geometric relationship with the X-ray source, enabling the large-area detector to maintain uniform image quality across all regions despite varying oblique incidence angles.
Solution Approach 2:
The patent creates a universal correction method that works across all energy bins simultaneously. The correction values calculated based on geometric parameters (incident angle, detection position) are applicable to all energy ranges, providing consistent position alignment for spectral imaging across the entire energy spectrum without requiring energy-specific corrections.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively corrects for oblique X-ray incidence, improving spatial resolution and image quality by accurately determining the reconstruction position and adjusting weights for each energy bin, resulting in reduced image elongation and enhanced accuracy in spectral imaging.
Implementation Method 1
an X-ray detector including a semiconductor crystal and plural reading electrodes; the semiconductor crystal directly converts an incident X-ray into an electrical signal
Implementation Method 2
an X-ray tube that generates an X-ray; an X-ray generator that generates high-voltage electricity to be applied to the X-ray tube
Data Source
AI summary
A radiation diagnostic apparatus according to an embodiment includes plural radiation detection elements and a processing circuitry. The radiation detection elements are arranged in a two-dimensional direction. The processing circuitry determines, based on a first output relating to a first detection element included in the radiation elements and a second output relating to a second detection element, an ideal output relating to the first detection element when it is assumed that a surface at which a radiation first arrives on the first detection element is an incident position of the radiation.