Detector Array Offset Compensation With Difference Averaging
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Solution Overview
Problem
Existing detector arrays exhibit non-uniform behavior due to offset variations among detectors, which affect image quality and require complex calibration processes.
Innovation Solution
A method and system that compensate for detector offsets by processing measurement arrays to determine offset arrays using difference operators and averaging techniques, allowing for rapid and accurate estimation of detector offsets without requiring frame-to-frame comparisons.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If complex calibration processes are used to compensate for detector offsets, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The system performs self-calibration by automatically computing offset compensation values from the captured image data itself. The processor analyzes the relationship between pixel values and detector elements to determine offset values without requiring external calibration equipment or manual intervention, making the calibration process self-service and reducing overall system complexity
Solution Approach 2:
The patent replaces complex mechanical calibration systems with computational methods. Instead of using physical calibration targets, mirrors, or mechanical adjustment mechanisms, the system uses digital image processing and mathematical computations to determine and apply offset compensation, substituting mechanical complexity with software-based solutions
2Measurement precision
If frame-to-frame comparisons are used for non-uniformity correction, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The system performs preliminary computation by establishing the relationship between pixel values and detector elements in advance. By pre-computing the mapping and offset values from the captured frames, the system prepares correction data before it is needed for actual non-uniformity correction, reducing the time required during critical processing stages
Solution Approach 2:
The patent extracts only the essential offset information from the image data without requiring full frame-to-frame comparison. By taking out and isolating the specific offset values needed for correction, the system avoids the computational overhead of comparing entire frames, reducing processing time while maintaining correction accuracy
3Measurement precision
If detailed local gradient processing is used for non-uniformity correction, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent replaces complex gradient computation mechanisms with direct offset subtraction. Instead of calculating spatial gradients, temporal gradients, and applying multiple filtering operations, the system uses the pre-determined offset values to directly correct pixel values, substituting complex processing mechanics with simple arithmetic operations
4Measurement precision
If multiple difference values are calculated for each pixel, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The system extracts only the necessary offset information from the image data by directly computing the relationship between pixel values and detector elements. By taking out the essential offset values without calculating multiple difference values for each pixel, the system reduces computation time while maintaining the precision needed for accurate offset compensation
Data Source
AI summary
An image processing method including: receiving a plurality of image frames from a detector array, wherein each image frame includes a measurement array of pixel values; computing a difference array from each measurement array, to provide a plurality of difference arrays, wherein the elements of the difference array comprise: a selected element which is set to zero; elements which are computed as a difference between: a corresponding measurement array element; and another element of the measurement array; or a linear combination of other elements of the measurement array; averaging the plurality of difference arrays to provide an average difference array; and determining an offset array using the average difference array.