Solid-State Radiation Detector Offset Correction
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Solution Overview
Problem
Existing X-ray imaging systems with solid-state radiation detectors face challenges in quickly and accurately correcting image signals to remove offset components, leading to prolonged waiting times and inefficiencies in workflow, as well as inaccuracies in acquiring offset information due to residual latent image charges.
Innovation Solution
A method and apparatus that acquire high frequency and low frequency offset component information separately, with high frequency information stored beforehand and low frequency information acquired just before imaging, allowing for rapid and accurate correction of image signals using a combination of these offset components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If offset component information is acquired from all pixels before imaging operation, then accurate correction of image signals is achieved, but imaging operation cannot start for a long time
Solution Approach 1:
The patent segments offset component information into high-frequency components (acquired previously and stored) and low-frequency components (acquired immediately before imaging). This segmentation allows the system to use stored high-frequency data to avoid long waiting periods while maintaining correction accuracy through the addition of freshly acquired low-frequency data.
Solution Approach 2:
The system performs preliminary acquisition of high-frequency offset component information before imaging operations and stores it for reuse. This preliminary action eliminates the need to acquire all offset data before each imaging operation, significantly reducing waiting time while maintaining correction accuracy through the combination with low-frequency components acquired immediately before imaging.
2Productivity
If offset component information is acquired quickly, then workflow efficiency is improved, but accuracy of offset information is reduced due to residual latent image charges
Solution Approach 1:
The patent separates offset component information into high-frequency components (acquired previously when the detector was clean) and low-frequency components (acquired immediately before imaging). This segmentation allows the system to use the accurate high-frequency data stored from previous acquisitions while supplementing it with current low-frequency data, achieving both speed and accuracy.
Solution Approach 2:
The patent introduces low-frequency offset component information as an intermediary that bridges the gap between quickly acquired (but potentially inaccurate) high-frequency data and the need for accurate current offset information. By combining these two types of data, the system achieves accurate correction without lengthy acquisition times.
3Manufacturing precision
If all offset component information is acquired before imaging, then accurate image signal correction is achieved, but imaging workflow is prolonged
Solution Approach 1:
The patent divides offset correction into two segments: high-frequency offset components acquired previously and stored, and low-frequency offset components acquired immediately before imaging. This segmentation allows the system to perform accurate correction using combined data without requiring all offset information to be acquired before imaging starts, thus shortening workflow duration.
Solution Approach 2:
The system performs preliminary acquisition and storage of high-frequency offset component information from previously acquired offset signals. This preliminary action allows the system to avoid re-acquiring all offset data before each imaging operation, significantly reducing workflow duration while maintaining correction accuracy through the combination with current low-frequency components.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables quick and accurate removal of offset components from image signals, improving workflow efficiency and allowing for immediate viewing of acquired images without the need for prolonged waiting times.
Implementation Method 1
With the photo conversion type of the solid-state radiation detector, fluorescence, which has been produced by a fluorescent substance when X-rays have been irradiated to the fluorescent substance, is detected by a photo-conductor layer, and signal electric charges having thus been generated in the photo-conductor layer are accumulated at a charge accumulating section
Implementation Method 2
With the direct conversion type of the solid-state radiation detector, signal electric charges, which have been generated in a photo-conductor layer when the X-rays have been irradiated to the photo-conductor layer, are collected with a charge collecting electrode and accumulated at a charge accumulating section
Implementation Method 3
With the optical read-out type of the solid-state radiation detector, reading light (a reading electromagnetic wave) is irradiated to the solid-state radiation detector, and electric charges having been accumulated are thereby read out
Data Source
AI summary
High frequency offset component information is previously acquired from a solid-state radiation detector. Low frequency offset component information is acquired from the solid-state radiation detector before an operation for recording image information on the solid-state radiation detector is performed. The image signal, which has been outputted from the solid-state radiation detector having been subjected to the operation for recording the image information, is corrected in accordance with offset information, which is constituted of the high frequency offset component information and the low frequency offset component information. The image signal is thus capable of being corrected quickly and accurately such that offset components are removed from the image signal.