Detector Sub-pixel Area Variation for Grid Interference

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Solution Overview

Problem

In radiation imaging apparatuses, the increased number of detector sub-pixels leads to sensitivity variations due to interference with the grid, resulting in reduced correction accuracy under high counting rates.

Innovation Solution

The radiation imaging apparatus employs a grid that removes scattered beams and arranges detector sub-pixels to divide the gap between grid walls into three or more segments, with each sub-pixel's area below the grid being larger than those not under the grid, ensuring uniform sensitivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the number of detector sub-pixels is increased to reduce pixel size and improve resolution, then measurement precision is improved, but sensitivity becomes non-uniform due to grid interference

Engineering Contradiction:
Improvepixel sizeVSAvoidsensitivity uniformity
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent applies local quality by making detector sub-pixels have different areas based on their position relative to grid walls. Specifically, sub-pixels located below grid walls are given a larger area than those not below grid walls, compensating for the sensitivity reduction caused by grid interference in specific locations and achieving overall sensitivity uniformity across all sub-pixels.

Inventive Principle:
Principle #3Local quality

2Productivity

If the number of detector sub-pixels is increased to handle high counting rates, then productivity is improved, but correction accuracy deteriorates due to sensitivity variations

Engineering Contradiction:
Improvecounting rateVSAvoidcorrection accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent compensates for location-dependent sensitivity variations by assigning different areas to sub-pixels based on their position relative to grid walls. This local adjustment ensures that all sub-pixels, regardless of position, have uniform sensitivity, thereby maintaining high correction accuracy even when processing high counting rates with numerous sub-pixels.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances correction accuracy by achieving uniform sensitivity across detector sub-pixels, improving performance under high counting rates and reducing the complexity of correction calculations.

Implementation Method 1

a grid that removes scattered beams that emanate from an object

Methodology Applied
Scientific EffectScattering: Scattering

Implementation Method 2

a technique is known to design so as to have a large pixel size and a reduced number of electric charge sharing boundaries at low flux... a plurality of metallized anodes that collects electric charge generated in a direct conversion material

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS10299746B2Radiation imaging apparatus
Publication Date: 2019.05.28 FUJIFILM CORP
  • US10299746B2 patent drawing
  • US10299746B2 patent drawing
  • US10299746B2 patent drawing

AI summary

A radiation imaging apparatus provided with a detector capable of improving correction accuracy at a high counting rate. The present invention is provided with: grids that remove scattered beams that emanate from an object; and a plurality of detector sub-pixels arranged so as to divide the gap between the grids into three or more segments, wherein the area of each of the detector sub-pixels located below the wall surface of the grids is larger than that of each of the other detector sub-pixels in a planar view. The size of each of the detector sub-pixels not located below the wall surface of the grids is expressed as (Pg−Tg−Lsplit×2)/N, where Pg represents the pitch between the grids, Tg represents the thickness of each of the grids, and N represents the number of segments formed by the detector sub-pixels between the grids.