Developer Nozzle Layout for Uniform Photoresist Development

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Solution Overview

Problem

High viscosity photoresist materials used in semiconductor processing often result in uneven photoresist layers due to resistance to flow, leading to thicker layers near the center of substrates and incomplete removal during development, which can cause residue and interfere with subsequent etching or ion implantation operations.

Innovation Solution

A developer tool with a dispenser that has a greater quantity of nozzles in the central portion relative to the perimeter portion, allowing for more effective removal of photoresist material from thicker areas near the center of substrates, thereby reducing residue and improving processing yield and quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If high viscosity photoresist materials are used, then photoresist layer thickness can be maintained, but uneven distribution occurs with thicker layers near the center

Engineering Contradiction:
Improvephotoresist layer thicknessVSAvoidphotoresist layer uniformity
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The patent applies local quality by varying the nozzle density distribution across the dispenser - with higher nozzle density in the central region and lower density at the periphery. This local variation in dispenser structure compensates for the non-uniform flow characteristics of high viscosity photoresist, enabling uniform thickness distribution across the substrate despite the material's inherent resistance to flow.

Inventive Principle:
Principle #3Local quality

2Device complexity

If conventional dispensing is used, then process simplicity is maintained, but photoresist residue remains in thicker central areas

Engineering Contradiction:
Improvedispenser structureVSAvoiddevelopment completeness
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The dispenser structure implements local quality through spatially varying nozzle density, with concentrated nozzles in the central region targeting the thicker photoresist areas. This localized structural adaptation ensures complete photoresist removal in the problematic central regions without requiring complete redesign of the entire dispensing system.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the dispenser into multiple nozzle groups with different densities - a high-density central region and a lower-density peripheral region. This segmentation allows independent optimization of each zone to address the specific development challenges of that area, improving overall development completeness.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The developer tool effectively reduces photoresist residue and scum on substrates, enhances semiconductor processing yield, and improves the quality of semiconductor devices by ensuring more uniform development of photoresist layers.

Implementation Method 1

the chemical developer agent may dissolve exposed or unexposed portions of the photoresist layer to expose the pattern

Methodology Applied
Scientific EffectDissolution: Solvation

Data Source

PatentUS12235582B2Semiconductor developer tool and methods of operation
Publication Date: 2025.02.25 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12235582B2 patent drawing
  • US12235582B2 patent drawing
  • US12235582B2 patent drawing

AI summary

A developer tool described herein includes a dispenser that includes a greater quantity of nozzles in a central portion relative to a perimeter portion such that the developer tool is capable of more effectively removing material from a photoresist layer near a center of a substrate (which tends to be thicker near the center of the substrate relative to the edge or perimeter of the substrate). In this way, the developer tool may reduce the amount of photoresist residue or scum remaining on the substrate near the center of the substrate after a development operation, which may enable defect removal and/or prevention, may increase semiconductor processing yield, and/or may increase semiconductor processing quality.