Microelectronic Device Current Reduction During Testing
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Solution Overview
Problem
Modern power integrated circuits require higher testing currents than typical testers can provide, leading to increased costs and reduced device longevity due to high current operations when multiple testers are used in parallel.
Innovation Solution
A system and method that electrically isolates a portion of the electronic device, allowing a reduced current to flow through it for testing, enabling the determination of the shut-off current or regulation of current flow, using a microelectronic device with sections of varying transistor counts and current-carrying capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If multiple testers are connected in parallel to provide sufficient current for testing modern power ICs, then the testing capability is improved, but the system cost and complexity increase
Solution Approach 1:
The device under test is divided into multiple sections, with a first section containing a first plurality of transistors and a second section containing a second plurality of transistors. The tester selectively activates only the first section during testing, allowing adequate testing of current handling capability while using a single tester instead of multiple parallel testers.
Solution Approach 2:
The patent applies local quality by creating non-uniform transistor distribution across sections, where the first section has a specific number of transistors suitable for testing within the tester's current capability (e.g., 10 A), while the second section has additional transistors that remain inactive during testing. This allows the testing apparatus to be optimized for a specific current range.
2Measurement precision
If high current is used to fully test modern power ICs with high current channels, then the testing completeness is improved, but the device temperature increases and reliability decreases
Solution Approach 1:
The patent applies partial action by testing only a portion (first section) of the device's total transistor array rather than activating all transistors. This partial testing approach provides sufficient measurement of current handling capability and thermal performance without subjecting the entire device to high current stress that would cause excessive temperature rise and reduce reliability.
Data Source
AI summary
A system (28) includes a microelectronic device (10) including first transistors (22) and second transistors (24), a power supply (40) electrically connected to the first and second transistors to provide power to the first and second transistors such that current flows through the first and second transistors, a switch (32) in operable communication with the second transistors, the switch allowing current to flow from the power supply through the second transistors when in a first mode of operation and preventing current from flowing from the power supply through the second transistors when in a second mode of operation, control circuitry in operable communication with the switch, and current sensing circuitry coupled to the first transistors to detect a test amount of current flowing through at least one of the first transistors when the switch is in the first mode of operation.