Device Inspection Apparatus for Cleaning Necessity Determination
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Solution Overview
Problem
Traditional methods for inspecting electronic devices for contaminants are labor-intensive, prone to human error, and inefficient when dealing with large quantities of devices, often resulting in unnecessary device opening and potential damage.
Innovation Solution
A device inspection apparatus that includes an enclosure to hold a device, with air flow blown through the device to disperse particulates, which are then observed by a particulate sensor to determine the necessity of cleaning based on predetermined levels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional physical inspection methods are used to check for contaminants, then inspection accuracy can be maintained, but labor intensity increases and human error occurs
Solution Approach 1:
The patent replaces manual physical inspection with an automated optical inspection system that uses a camera to capture images of device vents and a machine learning model to detect contaminants. This substitution eliminates human labor intensity and subjective judgment while maintaining consistent inspection accuracy across all devices.
Solution Approach 2:
The patent introduces an intermediary machine learning model that acts as a bridge between the captured images and the final inspection decision. The model processes images and provides standardized contamination assessments, replacing direct human inspection while maintaining measurement precision through algorithmic consistency.
2Measurement precision
If all received devices are opened for inspection, then contamination detection accuracy is maximized, but device damage risk increases
Solution Approach 1:
The patent performs preliminary inspection by capturing images of device vents through openings without fully opening the device enclosure. The machine learning model analyzes these preliminary images to assess contamination levels, allowing the system to identify devices that truly require opening for cleaning while avoiding unnecessary opening of clean devices.
Solution Approach 2:
The patent applies partial inspection by examining only the vent areas through openings rather than fully opening all devices. This partial action is sufficient to detect most contaminants while significantly reducing the risk of damage to delicate device structures. Devices flagged as contaminated by the partial inspection then receive full opening inspection.
3Ease of operation
If manual inspection methods are used, then device handling is simple, but processing speed decreases for large quantities
Solution Approach 1:
The patent implements continuous automated inspection where devices move through the inspection station and are imaged, analyzed, and classified in an uninterrupted sequence. The machine learning model processes images in real-time as devices pass through, enabling high-volume processing without the interruptions inherent in manual inspection methods.
Solution Approach 2:
The inspection system is self-operating, with the machine learning model automatically analyzing images and making contamination determinations without human intervention. The system self-manages the inspection process from image capture through contamination assessment, dramatically increasing processing speed while maintaining ease of operation through automated device handling.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus reduces the need to open devices for cleaning, thereby lowering labor costs and minimizing the risk of damage to devices with delicate structures, while efficiently handling large volumes of devices.
Implementation Method 1
blowing an air flow into the enclosure and through the device to disperse particulates within the device into the air flow
Implementation Method 2
a particulate sensor positioned to observe the air flow
Data Source
AI summary
A device inspection apparatus includes an enclosure for holding a device while air is blown through it. The air flow enters through an enclosure intake, passes through the device, and exits past a particulate sensor. The sensor provides a level of particulates in the air flow. This value is used to determine if the device requires cleaning. This can reduce labor costs as only devices that need cleaning are opened. The device cleaning apparatus can be used for various devices with vents, such as set top boxes, desktop computers, and laptops.