Device Malfunction Detection via Sensor Correlation
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Solution Overview
Problem
Devices such as printers and scanners often experience minor malfunctions that are not reported to technicians, leading to chronic problems going undetected.
Innovation Solution
A system that includes a server and a device with sensors to detect device events and external events, allowing for the identification of device malfunctions based on correlations between these events.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If users rectify minor malfunctions themselves, then ease of operation is improved, but reliability deteriorates due to unreported chronic problems
Solution Approach 1:
The system implements automated feedback mechanisms where sensors continuously monitor device operation and automatically report malfunctions to a remote server. This feedback loop ensures that even when users rectify minor issues themselves, the system remains informed about device status and can identify chronic problems through aggregated data from multiple sources.
Solution Approach 2:
The system enables self-service through automated monitoring and diagnosis capabilities. Sensors and processing units detect and analyze malfunctions autonomously, allowing the device to self-diagnose issues without requiring user technical knowledge, while still maintaining reliable tracking of chronic problems through automated reporting.
2Reliability
If automated monitoring is implemented, then reliability is improved through better problem detection, but device complexity increases
Solution Approach 1:
The monitoring system is segmented into distinct functional modules: sensors for data collection, processing units for analysis, and communication interfaces for reporting. This segmentation allows each component to perform its specific function efficiently while reducing overall system complexity through modular design.
Solution Approach 2:
The system employs multi-functional sensors and processing units that can detect various types of malfunctions using the same hardware components. This universality reduces device complexity by avoiding the need for specialized components for each specific malfunction type, while maintaining comprehensive monitoring capability.
Data Source
AI summary
An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the external event occurring external to the subject device; and identifying a device malfunction at the subject device based on the device event indicator and the external event indicator.