Cost Estimation for Device Testing Using Memory Analysis
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Solution Overview
Problem
Current testing methods for devices like system-on-a-chip (SOC) do not provide clear memory requirements for executing test vectors, making it difficult for customers and test designers to estimate costs effectively.
Innovation Solution
A system that reads test files containing multiple test vectors, determines the required memory needed to execute these vectors, and uses this information to estimate the cost, incorporating a billing predictor to calculate costs based on memory usage and billing schemes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If functional testing with precisely timed test vectors is performed, then device operational verification is improved, but memory requirements and cost estimation difficulty increase
Solution Approach 1:
The patent analyzes test files beforehand to determine memory requirements before actual device testing occurs. This preliminary analysis allows customers to know the memory resources needed in advance, resolving the contradiction by preparing memory allocation in advance rather than determining it during the testing process.
2Reliability
If structural testing with test vector shifting is performed, then device element verification is improved, but memory requirements and cost estimation difficulty increase
Solution Approach 1:
The system performs preliminary analysis of structural test files to calculate memory requirements before executing the actual structural testing. This advance determination of memory needs allows proper resource allocation for test vector shifting operations without increasing the complexity of the testing process itself.
3Loss of information
If detailed test vector execution analysis is performed, then accurate cost estimation is improved, but testing process complexity increases
Solution Approach 1:
The testing system automatically analyzes test files and calculates memory requirements and cost estimates without requiring external intervention or complex manual processes. The system serves itself by autonomously determining resource needs from the test file specifications, improving cost estimation accuracy while avoiding additional process complexity.
Data Source
AI summary
Methods and systems for estimating cost for device testing are disclosed. In one embodiment, the method comprises reading a test file having a plurality of test vectors, determining a required memory needed to execute the plurality of test vectors, and using the required memory to estimate a cost to execute the test vectors.