Diagnostic Circuit Testing With Programmable Reference Multiplexors
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
As circuit geometries shrink and become more complex, diagnostic and safety testing becomes increasingly challenging due to the need for multiple, adaptable test signals in Automatic Test Equipment (ATE) systems, which can become unwieldy when dealing with numerous or changing circuitry configurations.
Innovation Solution
An integrated circuit with dynamically configurable and programmable diagnostic test circuits that utilize multiplexors and a reference circuit to selectively output diagnostic and reference signals for comparison, controlled by a controller to determine fault signals based on predetermined thresholds.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If fixed reference sources are used for each diagnostic test, then test signal comparison is straightforward, but the system becomes unwieldy when dealing with numerous or changing circuitry configurations
Solution Approach 1:
The patent implements a universal test signal generation system where a single reference source can serve multiple diagnostic tests through programmable control. The reference signal generator responds to control signals to provide different reference signals dynamically, eliminating the need for separate fixed reference sources for each test while maintaining adaptability to changing circuitry configurations
Solution Approach 2:
The system transitions from static fixed reference sources to dynamic programmable reference signal generation. The reference signal generator can be reconfigured via control signals to adapt to different diagnostic tests and circuitry changes, providing flexibility without increasing physical system complexity
2Reliability
If components are replicated for each diagnostic test, then each test has dedicated reference signals, but manufacture becomes unwieldy
Solution Approach 1:
The patent merges multiple fixed reference sources into a single programmable reference signal generator. This consolidation maintains test accuracy by providing dedicated reference signals for each test through programmable selection, while dramatically simplifying manufacturing by eliminating the need to replicate reference signal components for each diagnostic test
3Adaptability or versatility
If ATE requires adaptation to particular DUT within particular IC, then testing is specific to each configuration, but the system becomes cumbersome when tests need modification
Solution Approach 1:
The system enables adaptation to different DUT configurations by changing control parameters rather than physical reconfiguration. The programmable reference signal generator responds to control signals that encode test specifications, allowing the same hardware to adapt to various DUTs and circuitry configurations without physical modification or increased system complexity
Data Source
AI summary
An integrated circuit including a first multiplexor configured to receive one of a plurality of diagnostic signals from circuitry under test (DUT), the first multiplexor responsive to diagnostic signals provided thereto and configured to selectively output one of the diagnostic signals in response to a control signal, a second multiplexor configured to receive one of a plurality of reference signals from one of a plurality of nodes on a reference circuit, the second multiplexor configured to selectively output one of the diagnostic signals in response to a control signal, and a comparator configured to compare the diagnostic signal elicited from the first multiplexor with the reference signal elicited from the second multiplexor, the comparator further configured to output the result of the comparison between the diagnostic signal and the reference signal.