Diagnostic Test System End-of-Life Disabling Mechanism
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Solution Overview
Problem
Point-of-care diagnostic test systems require high sensitivity while maintaining low costs, but conventional systems often use less sensitive components due to cost constraints, necessitating a solution for enabling high-sensitivity testing within affordable price points.
Innovation Solution
Incorporating a disabling unit that determines the current lifetime of test components and automatically disables the system when the end-of-life threshold is met, allowing for the use of low-cost optoelectronic devices with shorter lifetimes, ensuring high sensitivity and accuracy without the need for costly, durable components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If low-cost optoelectronic devices with shorter lifetimes are used, then the cost of the diagnostic test system is reduced, but the reliability of the system deteriorates
Solution Approach 1:
The patent applies preliminary action by implementing a disabling unit that proactively monitors component usage and disables the system before actual failure occurs. The disabling unit tracks the operational lifetime of optoelectronic devices and automatically deactivates the diagnostic test system when a predetermined lifetime threshold is reached, preventing reliability degradation while enabling the use of cost-effective components with shorter natural lifetimes
Solution Approach 2:
The system applies self-service through the disabling unit that autonomously monitors component status, determines when end-of-life is reached, and disables the system without external intervention. The disabling unit independently manages the lifecycle of optoelectronic components, eliminating the need for manual tracking or external reliability management while enabling widespread adoption of affordable diagnostic systems
2Productivity
If components are used beyond their designed lifetime, then productivity is maintained, but measurement precision deteriorates due to component degradation
Solution Approach 1:
The disabling unit implements preliminary action by disabling the diagnostic test system before optoelectronic components actually fail or degrade beyond acceptable thresholds. By proactively monitoring component lifetime and disabling the system at the predetermined end-of-life point, the patent ensures measurement precision is maintained throughout the component's operational life while preventing productivity loss from unexpected failures
Data Source
AI summary
Systems and methods for end-of-life disabling of a diagnostic test system are described. In one aspect, a diagnostic test system that includes a test unit and a disabling unit. The test unit performs at least one diagnostic test on a diagnostic assay to determine whether at least one analyte is present within a sample. The disabling unit determines a measure of current lifetime of the test unit and disables the test unit in response to a determination that the current lifetime measure meets an end-of-life threshold. In a diagnostic test method, at least one diagnostic test is performed on a diagnostic assay to determine whether at least one analyte is present within a sample. A measure of current lifetime of the test unit is determined. The test unit is disabled in response to a determination that the current lifetime measure meets an end-of-life threshold.