Diagonal Via Layout for Dense Semiconductor Layer Connections

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Solution Overview

Problem

Existing semiconductor structures face challenges in connecting components and conductive layers due to space limitations and vertical distance constraints, leading to issues like crowding and potential shorting of metal diffusion regions.

Innovation Solution

The implementation of diagonal vias that extend at an angle to connect conductive layers and components, allowing for efficient electrical coupling by etching a dielectric layer to create a diagonally etched cavity and growing a conductor within it, thereby alleviating space constraints and preventing shorting.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If vertical vias are used to connect conductive layers, then electrical connection is achieved, but space is wasted and crowding occurs

Engineering Contradiction:
Improveelectrical connectionVSAvoidspace utilization
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent transitions from vertical via connections to diagonal via connections, changing the dimensional orientation of the connection path. This diagonal approach utilizes previously unused diagonal space in the layout, effectively increasing space utilization while maintaining electrical connectivity between conductive layers.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Area of stationary object

If conductive layers are placed closer together, then space is optimized, but shorting risk increases

Engineering Contradiction:
Improvespace optimizationVSAvoidshorting risk
Core Design Contradiction:
Area of stationary objectVSObject-affected harmful factors

Solution Approach 1:

The patent introduces asymmetric diagonal spacing between conductive layers rather than uniform vertical spacing. The diagonal vias create unequal horizontal and vertical distances, which increases the effective clearance between adjacent conductive layers in the horizontal plane, thereby reducing shorting risk while maintaining compact vertical integration.

Inventive Principle:
Principle #4Asymmetry

3Area of stationary object

If diagonal vias are implemented, then space utilization improves, but manufacturing complexity increases

Engineering Contradiction:
Improvespace utilizationVSAvoidmanufacturing complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The patent employs preliminary patterning steps where mandrels are formed first, followed by dielectric layer deposition and subsequent etching. This sequence of pre-planned actions simplifies the overall manufacturing process by breaking down the complex diagonal via formation into manageable, standardized fabrication steps that can be integrated into existing CMOS processing flows.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Diagonal vias enhance connectivity in integrated circuits, optimizing the use of limited conductive resources and reducing manufacturing risks by providing efficient connections without overcrowding or shorting.

Implementation Method 1

etching a dielectric layer with a plasma ion beam to create a diagonally etched cavity

Methodology Applied
Scientific EffectPlasma etching: Plasma

Implementation Method 2

growing a conductor in the diagonally etched cavity

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS20250329658A1Diagonal vias in semiconductor structures
Publication Date: 2025.10.23 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250329658A1 patent drawing
  • US20250329658A1 patent drawing
  • US20250329658A1 patent drawing

AI summary

A semiconductor structure including a first conductive layer, a second conductive layer situated above the first conductive layer, and a via extending diagonally between the second conductive layer and the first conductive layer to electrically connect the first conductive layer to the second conductive layer.