Diamond Electric Field Sensor With Optical Fluorescence Readout
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Solution Overview
Problem
Existing electric field sensors face limitations in achieving high sensor density due to the need for metal connections and amplifiers, which restricts their integration and density.
Innovation Solution
A sensor architecture utilizing fluorescent defects in diamond, located near the positively doped surface, allows for high-density integration without electrical connections or amplifiers by measuring fluorescence changes caused by recombination and electric field-induced charge states.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If metal connections and amplifiers are used to connect sensors for readout, then sensor functionality is achieved, but sensor density is limited due to the minimum possible sizes of amplifiers and connection complexity
Solution Approach 1:
The patent replaces electrical readout mechanisms (metal connections and amplifiers) with an optical readout system. Fluorescent defects in diamond emit light signals that can be detected optically, eliminating the need for physical electrical connections and on-chip amplifiers. This substitution enables significantly higher sensor density since optical detection does not require minimum-sized electronic components at each sensor location.
2Area of moving object
If the active area of semiconductor devices is reduced to increase density, then device size is reduced, but connection difficulty increases making it very difficult to connect devices with metal connections
Solution Approach 1:
The patent replaces mechanical/electrical connection methods with optical detection. Since the readout is performed through optical detection of fluorescence emissions, the sensors do not require metal connections regardless of their size. This allows the active area to be reduced to increase density without compromising connection ease.
3Measurement precision
If amplifiers are added to each sensor to enable readout, then sensor functionality is improved, but sensor density is limited due to the minimum possible sizes of these amplifiers
Solution Approach 1:
The patent replaces electronic amplifiers with an optical detection system. The fluorescent defects in diamond naturally emit light signals that can be detected by optical apparatus, eliminating the need for electronic amplification at each sensor location. This reduces device complexity and enables higher sensor density.
Solution Approach 2:
The patent uses optical copying/detection instead of electronic amplification. The fluorescence signal from each defect acts as an optical copy of the electric field information, which can be detected and read out without requiring physical electronic amplifiers at each sensor location.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables significantly higher sensor densities with optical readout, overcoming the limitations of traditional sensors by providing high sensitivity and resolution through fluorescence measurement.
Implementation Method 1
The number of charged defects depends on the external field strength and can be measured by detecting the resultant fluorescence, since the charge state of the defects changes their fluorescence.
Implementation Method 2
the multiple defects are located at a depth below the surface to enable the positive charge carriers to reach and positively charge the multiple defects under an influence of an external negative electric field
Data Source
AI summary
This disclosure relates to an electrical field sensor. The sensor comprises a diamond substrate with a conducting surface providing positive charge carriers and multiple defects disposed in the diamond substrate. The sensor further comprises an optical apparatus to initialise and readout the multiple defect vacancies to determine the electrical field based on a detected fluorescence of the multiple defects. The multiple defects are located at a depth below the surface to enable the positive charge carriers to reach and positively charge the multiple defect vacancies under an influence of an external negative electric field to thereby alter the fluorescence of at least some of the multiple defects. Since the fluorescence can be measured optically, no electrical connections or amplifiers are required on the surface, which means significantly higher densities of sensors can be implemented.