Diamond-Layer Semiconductor Structure With Micro Through-Hole Routing

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Solution Overview

Problem

Conventional semiconductor devices using diamond substrates face challenges in miniaturization and heat dissipation due to the difficulty in forming micro through holes, which are essential for improving both characteristics simultaneously.

Innovation Solution

A semiconductor device design featuring a substrate with a protrusion and a diamond layer, where a through hole penetrates the protrusion, base, and semiconductor layer, allowing for heat transfer to the diamond layer without processing the diamond substrate, and a second metal layer covers the inner side of the through hole for electrical connection, enabling miniaturization and enhanced heat dissipation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If a diamond substrate is used to improve heat dissipation, then heat dissipation performance is improved, but it becomes impossible to form micro through holes for miniaturization

Engineering Contradiction:
Improveheat dissipation performanceVSAvoidminiaturization capability
Core Design Contradiction:
TemperatureVSLength of moving object

Solution Approach 1:

The substrate is divided into a base portion and a protrusion portion, with the through hole formed only in the protrusion portion. This segmentation allows the through hole to be created in a non-diamond material region while maintaining the diamond substrate for heat dissipation, thus resolving the contradiction between heat dissipation performance and miniaturization capability.

Inventive Principle:
Principle #1Segmentation

2Length of moving object

If micro through holes are formed in the diamond substrate to enable miniaturization, then miniaturization is achieved, but the manufacturing process becomes extremely difficult

Engineering Contradiction:
Improveminiaturization capabilityVSAvoidmanufacturing process difficulty
Core Design Contradiction:
Length of moving objectVSEase of manufacture

Solution Approach 1:

The protrusion portion is formed with different material properties or structural characteristics compared to the base diamond substrate. This local quality difference enables the through hole to be formed easily in the protrusion portion using conventional semiconductor manufacturing techniques, while the diamond base substrate maintains its excellent heat dissipation properties without requiring difficult micro-hole formation processes.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design allows for the simultaneous improvement of miniaturization and heat dissipation in semiconductor devices by facilitating the formation of micro through holes without requiring a mask for processing the diamond layer, thereby reducing the number of steps and ensuring effective heat transfer.

Implementation Method 1

a diamond layer having a third surface in contact with the second surface... Simultaneous improvement of miniaturization and heat dissipation

Methodology Applied
Scientific EffectHeat conduction: Conduction (thermal)

Data Source

PatentUS20240379784A1Semiconductor device and method for manufacturing semiconductor device
Publication Date: 2024.11.14 SUMITOMO ELECTRIC INDUSTRIES LTD
  • US20240379784A1 patent drawing
  • US20240379784A1 patent drawing
  • US20240379784A1 patent drawing

AI summary

A semiconductor device includes a substrate having a base provided with a first surface and a second surface opposite to the first surface, and a protrusion protruding from the base in a direction opposite to the first surface, a semiconductor layer in contact with the first surface, a first metal layer provided on the semiconductor layer in contact with the semiconductor layer, and overlapping the protrusion in a plan view perpendicular to the first surface, a diamond layer having a third surface in contact with the second surface, and a fourth surface opposite to the third surface, and a second metal layer covering an inner side of a through hole and the fourth surface and electrically connected to the first metal layer. The through hole penetrates the protrusion, the base, and the semiconductor layer and reaches the first metal layer.