Diblock Copolymer Nano Patterning via Self-Assembly

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Solution Overview

Problem

Current photolithography techniques face limitations in forming nanostructures smaller than 30 nm, particularly cylindrical nanostructures in a square or rectangular shape, which are essential for semiconductor circuit design, due to technical constraints and high energy requirements, and existing block copolymers require complex synthesis or auxiliary materials for such patterns.

Innovation Solution

A diblock copolymer comprising a hard segment with acrylamide-based repeat units and a soft segment with (meth)acrylate-based repeat units, synthesized via RAFT polymerization, which self-assembles into regular cylindrical nanostructures in square or rectangular shapes upon solvent annealing or heat treatment, allowing for the formation of finer nano patterns without the need for additional masks or complex triblock copolymers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If photolithography is used to manufacture silicon devices, then process optimization and applications are improved, but manufacturing precision for 30 nm or less is deteriorated due to light dispersion and wavelength limitations

Engineering Contradiction:
Improveprocess optimizationVSAvoidfabrication precision
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent replaces the photolithography optical system with a self-assembly system using block copolymers. The mechanical/optical limitation of light wavelength is substituted by chemical self-organization of polymer blocks, which can achieve finer patterning without being constrained by light physics

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the fundamental parameter from optical wavelength (193 nm for conventional photolithography) to polymer domain size (controllable at 10-50 nm scale). By adjusting block copolymer composition, molecular weight, and processing conditions, the pattern size can be precisely tuned beyond the diffraction limit of light

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If electron beam lithography or EUV lithography is used, then manufacturing precision for fine patterns is improved, but device complexity and energy consumption are worsened

Engineering Contradiction:
Improvepattern fabrication precisionVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The block copolymer system performs self-assembly and self-patterning without requiring complex lithography equipment. The polymer automatically organizes into ordered structures through microphase separation, eliminating the need for electron beams, EUV sources, or sophisticated optical systems

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

Instead of using top-down approaches where external energy (electron beam or EUV) carves patterns into material, the patent employs a bottom-up approach where material spontaneously forms patterns through thermodynamic self-organization. This inverts the conventional manufacturing paradigm

Inventive Principle:
Principle #13The other way round (Inversion)

3Ease of manufacture

If PS-PMMA block copolymer is used to form cylindrical nanostructure in hexagonal shape, then ease of manufacture is improved, but adaptability to semiconductor circuit design is worsened due to mismatch with square/rectangular circuit layouts

Engineering Contradiction:
Improvenanostructure formation easeVSAvoidadaptability to circuit design
Core Design Contradiction:
Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The patent modifies specific local properties of the block copolymer system by introducing directional cues through substrate treatment or external fields. This allows the same material to form different patterns (hexagonal, square, rectangular) depending on local conditions, enabling adaptation to various circuit layouts without changing the base polymer

Inventive Principle:
Principle #3Local quality

4Adaptability or versatility

If triblock copolymer or additional materials are used to form cylindrical nanostructure in square shape, then adaptability to circuit design is improved, but device complexity and manufacturing time are worsened

Engineering Contradiction:
Improveadaptability to circuit designVSAvoidpolymer structure complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent develops a universal diblock copolymer platform that can produce multiple pattern types (hexagonal, square, rectangular cylindrical structures) by varying processing conditions rather than requiring different polymer chemistries. This multi-functional approach simplifies the material system while maintaining design flexibility

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The diblock copolymer enables the formation of regular cylindrical nanostructures in square or rectangular shapes, facilitating the creation of finer patterns suitable for semiconductor devices and nano biosensors, with reduced energy consumption and simplified processing compared to traditional methods.

Implementation Method 1

a nanostructure is simply formed by microphase separation between the chains of a block copolymer

Methodology Applied
Scientific EffectMicrophase separation:

Implementation Method 2

self-assembly method of a block copolymer is being studied

Methodology Applied
Scientific EffectSelf-assembly: Self-Assembly

Implementation Method 3

synthesized through RAFT polymerization

Methodology Applied
Scientific EffectRAFT polymerization: Photopolymerisation

Data Source

PatentUS9493588B2Diblock copolymer, preparation method thereof, and method of forming nano pattern using the same
Publication Date: 2016.11.15 LG CHEM LTD
  • US9493588B2 patent drawing
  • US9493588B2 patent drawing
  • US9493588B2 patent drawing

AI summary

The present invention relates to a diblock copolymer that may facilitate formation of a finer nano pattern, and be used for manufacture of an electronic device including a nano pattern or a bio sensor, and the like, a method for preparing the same, and a method for forming a nano pattern using the same,The diblock copolymer comprises a hard segment including at least one specific acrylamide-based repeat unit, and a soft segment including at least one (meth)acrylate-based repeat unit.