Semiconductor Die Package With Laser-Structured Low-Inductance Interconnects

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Solution Overview

Problem

The challenge of efficient heat dissipation and high-current conduction in miniaturized semiconductor power devices, particularly wide bandgap semiconductors like SiC and GaN, is exacerbated by design-rule limitations and insufficient frontside interconnects, leading to overheating and limited current output.

Innovation Solution

A method involving laser-assisted structuring of metallic structures on semiconductor dies to create frontside and backside electrical conductors, allowing for additive manufacturing of thick interconnects with low inductance, enabling efficient double-side cooling and relaxed design rules.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If the source pad area is reduced to accommodate miniaturized chip sizes, then the chip size is reduced, but the heat dissipation capability and current handling become insufficient

Engineering Contradiction:
Improvechip sizeVSAvoidheat dissipation capability
Core Design Contradiction:
Volume of moving objectVSTemperature

Solution Approach 1:

The patent applies 3D vertical stacking to extend the source pad area into the vertical dimension, creating multiple stacked source pads (e.g., 5 stacked source pads) that increase the effective heat dissipation and current handling area without increasing the chip's footprint area, thus resolving the contradiction between miniaturization and thermal management

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The source pad is segmented into multiple stacked segments (multiple source pads vertically stacked), where each segment can independently contribute to heat dissipation and current handling, effectively increasing the total functional area while maintaining a compact chip footprint

Inventive Principle:
Principle #1Segmentation

2Volume of moving object

If the source pad area is reduced for miniaturization, then the chip size is reduced, but the electric current handling capability decreases

Engineering Contradiction:
Improvechip sizeVSAvoidelectric current handling capability
Core Design Contradiction:
Volume of moving objectVSPower

Solution Approach 1:

Multiple source pads are stacked vertically to increase the total current handling area in the vertical dimension, allowing high current paths to be formed through multiple parallel channels without increasing the horizontal footprint, thus maintaining high power handling in miniaturized chips

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

Multiple source pads are electrically connected in parallel to combine their current handling capabilities, creating a unified high-current path that can handle substantial electric current while occupying minimal chip area

Inventive Principle:
Principle #5Merging (Combining)

3Ease of manufacture

If design rules require large clearance around source pad for clip soldering, then the manufacturing is simplified, but the remaining source pad area for cooling and current becomes very small

Engineering Contradiction:
Improveclip soldering clearanceVSAvoidsource pad area
Core Design Contradiction:
Ease of manufactureVSArea of stationary object

Solution Approach 1:

The source pad structure transitions from a 2D planar layout to a 3D vertical stack, allowing the effective source pad area to be increased vertically while reducing the horizontal footprint, thus providing sufficient area for cooling and current handling even with required clearances

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The source pad is divided into multiple stacked segments that can be independently formed and connected, allowing the interconnect structure to wrap around and connect to multiple segments, effectively increasing the electrical connection area while maintaining compact dimensions

Inventive Principle:
Principle #1Segmentation

4Speed

If conventional interconnect structures are used for high switching speeds, then the manufacturing is standard, but the inductance is too high

Engineering Contradiction:
Improveswitching speedVSAvoidinductance
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The interconnect structure utilizes vertical stacking to create short, direct current paths with minimal loop area, significantly reducing inductance compared to conventional planar interconnects, thus enabling high switching speed operation with low inductance

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The interconnect is segmented into multiple vertical sections that are stacked and connected, creating multiple parallel current paths that reduce overall inductance through parallel path effects and shorter current loops

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances heat dissipation and current conduction capabilities while reducing inductance, allowing for robust and efficient cooling solutions even with small contact pads, thus addressing the limitations of miniaturized semiconductor devices.

Implementation Method 1

Irradiating at least a portion of the metallic material with a laser beam

Methodology Applied
Scientific EffectLaser heating: Laser

Implementation Method 2

The laser beam is moved along the second contact pad and/or along the first contact pad in a predetermined pattern so that portions of the metallic material are melted and structured

Methodology Applied
Scientific EffectMelting: Melting

Data Source

PatentUS12604752B2Semiconductor die package
Publication Date: 2026.04.14 INFINEON TECH AUSTRIA AG
  • US12604752B2 patent drawing
  • US12604752B2 patent drawing
  • US12604752B2 patent drawing

AI summary

A semiconductor die package includes a semiconductor transistor die having a contact pad on an upper main face. The semiconductor die package also includes an electrical conductor disposed on the contact pad and fabricated by laser-assisted structuring of a metallic material, and an encapsulant covering the semiconductor die and at least a portion of the electrical conductor.