Die Pad Grooves for Delamination Resistance
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Solution Overview
Problem
Delamination issues between the mold compound and the lead frame, including the metal die pad, and between the die attach material and the die pad, leading to crack propagation that originates at the perimeter of the die pad, affecting the reliability of packaged ICs.
Innovation Solution
Incorporating grooves on the die pad oriented substantially perpendicular to the bisecting lines, which act as crack propagation barriers, thereby resisting crack growth and improving reliability by reducing delamination.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a conventional solid metal die pad is used, then the structure is simple and manufacturing is easy, but delamination occurs between the mold compound and the die pad, leading to crack propagation and reduced reliability
Solution Approach 1:
The die pad structure is segmented by introducing grooves that divide the continuous metal surface into distinct regions. These grooves create physical barriers that segment the stress distribution and prevent continuous crack propagation across the die pad surface, thereby improving delamination resistance without completely redesigning the overall structure.
Solution Approach 2:
The grooves are strategically positioned at specific locations on the die pad where delamination and crack initiation are most likely to occur. This local modification approach applies the segmentation principle only where needed, improving reliability at critical areas while maintaining the simplicity of the overall die pad structure and minimizing manufacturing complexity.
2Reliability
If the die pad structure is modified to prevent delamination, then reliability improves, but manufacturing complexity increases
Solution Approach 1:
The grooves are designed as simple linear features that can be easily formed using conventional manufacturing techniques such as laser drilling, mechanical routing, or etching. This segmentation approach adds minimal manufacturing steps compared to more complex structural modifications, maintaining ease of fabrication while effectively preventing crack propagation.
Solution Approach 2:
By concentrating the structural modification only in the form of grooves at critical locations rather than redesigning the entire die pad, the manufacturing process remains relatively simple. The grooves can be added as a post-forming operation or integrated into existing manufacturing workflows with minimal additional complexity.
Data Source
AI summary
A lead frame (410) including a die pad (100) for mounting at least one integrated circuit (405) thereon and a plurality of lead fingers (413). The die pad (100) includes a metal including substrate (105) having a periphery that includes a plurality of sides (111-114), an intersection of the sides forming corners (115). A first plurality of grooves including least one groove (106) is formed in a top side surface of the substrate and is associated with each of the corners (115). The groove (106) has a dimension oriented at least in part at an angle of 75 to 105 degrees relative to a bisecting line (118) originating from the corners (115). A lead-frame-based packaged semiconductor device (400) includes a lead frame (410) including at least one metal comprising die pad (418) and a plurality of lead fingers (413) around the die pad (418). At least one integrated circuit (405) is mounted on the top surface of the die pad (418), and electrically connected to the plurality of lead fingers (413). A mold compound (414) encapsulates the integrated circuit (405), wherein the mold compound (414) is present inside the first plurality of grooves to form a restraint from delaminating between the mold compound (414) and the die pad (418).


