Die Pad Grooves for Delamination Resistance

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Solution Overview

Problem

Delamination issues between the mold compound and the lead frame, including the metal die pad, and between the die attach material and the die pad, leading to crack propagation that originates at the perimeter of the die pad, affecting the reliability of packaged ICs.

Innovation Solution

Incorporating grooves on the die pad oriented substantially perpendicular to the bisecting lines, which act as crack propagation barriers, thereby resisting crack growth and improving reliability by reducing delamination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional solid metal die pad is used, then the structure is simple and manufacturing is easy, but delamination occurs between the mold compound and the die pad, leading to crack propagation and reduced reliability

Engineering Contradiction:
Improvedelamination resistanceVSAvoiddie pad structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The die pad structure is segmented by introducing grooves that divide the continuous metal surface into distinct regions. These grooves create physical barriers that segment the stress distribution and prevent continuous crack propagation across the die pad surface, thereby improving delamination resistance without completely redesigning the overall structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The grooves are strategically positioned at specific locations on the die pad where delamination and crack initiation are most likely to occur. This local modification approach applies the segmentation principle only where needed, improving reliability at critical areas while maintaining the simplicity of the overall die pad structure and minimizing manufacturing complexity.

Inventive Principle:
Principle #3Local quality

2Reliability

If the die pad structure is modified to prevent delamination, then reliability improves, but manufacturing complexity increases

Engineering Contradiction:
Improvecrack propagation resistanceVSAvoiddie pad fabrication
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The grooves are designed as simple linear features that can be easily formed using conventional manufacturing techniques such as laser drilling, mechanical routing, or etching. This segmentation approach adds minimal manufacturing steps compared to more complex structural modifications, maintaining ease of fabrication while effectively preventing crack propagation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

By concentrating the structural modification only in the form of grooves at critical locations rather than redesigning the entire die pad, the manufacturing process remains relatively simple. The grooves can be added as a post-forming operation or integrated into existing manufacturing workflows with minimal additional complexity.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS8154109B2Leadframe having delamination resistant die pad
Publication Date: 2012.04.10 TEXAS INSTRUMENTS INC
  • US8154109B2 patent drawing
  • US8154109B2 patent drawing
  • US8154109B2 patent drawing

AI summary

A lead frame (410) including a die pad (100) for mounting at least one integrated circuit (405) thereon and a plurality of lead fingers (413). The die pad (100) includes a metal including substrate (105) having a periphery that includes a plurality of sides (111-114), an intersection of the sides forming corners (115). A first plurality of grooves including least one groove (106) is formed in a top side surface of the substrate and is associated with each of the corners (115). The groove (106) has a dimension oriented at least in part at an angle of 75 to 105 degrees relative to a bisecting line (118) originating from the corners (115). A lead-frame-based packaged semiconductor device (400) includes a lead frame (410) including at least one metal comprising die pad (418) and a plurality of lead fingers (413) around the die pad (418). At least one integrated circuit (405) is mounted on the top surface of the die pad (418), and electrically connected to the plurality of lead fingers (413). A mold compound (414) encapsulates the integrated circuit (405), wherein the mold compound (414) is present inside the first plurality of grooves to form a restraint from delaminating between the mold compound (414) and the die pad (418).