Die Pair Temperature Sensor Layout for SoC Hotspot Tracking

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

In managing the temperature of complex systems on chip (SoCs), large thermal sensors consume significant silicon area, forcing them to be placed away from hotspots, which reduces operating frequency and performance due to design margin requirements.

Innovation Solution

Implementing a die pair topology where thermal sensors are placed in close planar proximity to hotspots on a base die, allowing accurate temperature tracking without being on the top die, thereby enabling higher operating frequencies and performance without design margin.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If large thermal sensors are placed at the hottest parts of the die to accurately measure worst-case temperature, then measurement precision is improved, but the critical logic needs to be significantly spaced out, worsening productivity

Engineering Contradiction:
Improvetemperature measurement accuracyVSAvoidoperating frequency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent moves the temperature sensor from the traditional 2D plane of the die to a 3D stacked configuration by placing the sensor on a separate die that is vertically integrated with the compute engine die. This allows the sensor to be positioned in close proximity to hot spots without consuming lateral silicon area, thus avoiding logic spacing requirements while maintaining accurate temperature measurement.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent divides the system into multiple independent dies: one die for the compute engine logic and another die for the temperature sensor. This segmentation allows each component to be optimized independently - the compute engine can maintain dense logic placement for high performance while the sensor is placed optimally for accurate temperature measurement near hot spots.

Inventive Principle:
Principle #1Segmentation

2Productivity

If thermal sensors are spaced farther away from hot spots to avoid spacing out logic, then productivity is improved, but the extra temperature difference to the hottest part of the die reduces operating frequency at a fixed voltage or power

Engineering Contradiction:
Improveoperating frequencyVSAvoidtemperature margin
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

By transitioning to 3D stacked architecture, the sensor can be positioned vertically close to hot spots without lateral spacing constraints. This eliminates the trade-off between sensor proximity and logic density, allowing the sensor to accurately measure peak temperatures while the compute engine maintains high operating frequency without temperature margins.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for accurate peak temperature tracking on the top die without sensors, maintaining high operating frequency and performance by judiciously placing sensors on the base die, avoiding the adverse effects of monolithic designs.

Implementation Method 1

a temperature sensor placed in a transistor layer of the base die in close planar proximity to at least one hot spot location in an additional transistor layer of the compute engine die

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS20240321668A1Temperature sensors in die pair topology
Publication Date: 2024.09.26 ADVANCED MICRO DEVICES INC
  • US20240321668A1 patent drawing
  • US20240321668A1 patent drawing
  • US20240321668A1 patent drawing

AI summary

A method for die pair partitioning can include providing a first circuit die having a first metal stack. The method can additionally include positioning a second circuit die having a second metal stack in a manner that places a temperature sensor in a transistor layer of the second circuit die in planar proximity to at least one hot spot located in an additional transistor layer of the first circuit die. The method can also include connecting the first metal stack of the first circuit die to the second metal stack of the second circuit die. Various other methods, systems, and computer-readable media are also disclosed.