Semiconductor Die Parceling Line for Automated Inspection and Bagging

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Modern manufacturing processes for semiconductor dies rely heavily on human skill and expertise for quality control, packaging, and maintenance, lacking automation in inspection and processing.

Innovation Solution

An integrated semiconductor die parceling platform that automates the inspection, bundling, bagging, and labeling of semiconductor dies using a conveyor system with robotic arms and stations, including load port, buffer, inspection, desiccant, bundle, bagging, and folding stations, ensuring seamless processing without human intervention.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If automated systems are introduced to replace human operations in semiconductor die processing, then productivity and consistency are improved, but device complexity and initial investment costs increase

Engineering Contradiction:
Improveprocessing throughputVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The automated parceling system is divided into distinct functional modules including inspection stations, bundling stations, bagging stations, and labeling stations. Each module performs a specific task in the semiconductor die processing workflow, allowing for independent optimization, easier maintenance, and modular scalability while maintaining high overall productivity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The automated parceling system is designed with multi-functional stations that can handle various semiconductor die types and packaging requirements. The inspection stations can detect multiple defect types, and the bundling/bagging/labeling stations can accommodate different product specifications, making the system versatile for diverse manufacturing needs

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Manufacturing precision

If comprehensive inspection and quality control processes are implemented, then manufacturing precision and reliability are improved, but processing time and operational complexity increase

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidprocessing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The inspection station performs comprehensive defect detection on semiconductor dies before they enter the bundling and packaging processes. By conducting inspection early in the workflow, defective dies are identified and removed beforehand, preventing waste of subsequent processing time and materials on defective products

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

Manual inspection and quality control operations are replaced with automated inspection systems that use optical sensors, imaging systems, and computer vision algorithms. This substitution enables high-speed, consistent defect detection without the time loss and variability associated with human inspection

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Ease of operation

If manual operations are used for packaging and quality control, then ease of operation and adaptability are maintained, but productivity and consistency deteriorate

Engineering Contradiction:
Improveoperational flexibilityVSAvoidpackaging throughput
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The automated parceling system incorporates programmable controllers and software interfaces that allow flexible adjustment of processing parameters, bundling configurations, and packaging specifications. This dynamic programmability maintains operational adaptability while achieving high-speed automated processing, eliminating the throughput limitations of manual operations

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS20250346380A1Integrated semiconductor die parceling platforms
Publication Date: 2025.11.13 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250346380A1 patent drawing
  • US20250346380A1 patent drawing
  • US20250346380A1 patent drawing

AI summary

In certain embodiments, a system includes: an inspection station configured to receive a die vessel, wherein the inspection station is configured to inspect the die vessel for defects; a desiccant station configured to receive the die vessel from the inspection station, wherein the desiccant station is configured to add a desiccant to the die vessel; a bundle station configured to receive the die vessel from the desiccant station, wherein the bundle station is configured to combine the die vessel with another die vessel as a die bundle; and a bagging station configured to receive the die bundle from the bundle station, wherein the bagging station is configured to dispose the die bundle in a die bag and to heat seal the die bag with the die bundle inside.