Semiconductor Die Recesses for Mechanical Debonding in Die Stacking

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Solution Overview

Problem

Existing semiconductor die stacking processes face challenges in efficiently removing poorly stacked dies during manufacturing, as conventional methods lack effective mechanisms for mechanical debonding, leading to difficulties in reworking and ensuring proper alignment and bonding.

Innovation Solution

The introduction of peripheral recesses on semiconductor dies, with depths significantly greater than the bonding structure thickness, allows for the insertion of a pick device to mechanically debond and remove misaligned dies, facilitating the reworking of semiconductor devices during manufacturing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of repair

If conventional semiconductor die stacking processes are used without peripheral recesses, then the bonding structure remains intact and stable, but poorly stacked dies cannot be efficiently removed during manufacturing

Engineering Contradiction:
Improveease of removing poorly stacked diesVSAvoidbonding structure integrity
Core Design Contradiction:
Ease of repairVSStrength

Solution Approach 1:

The peripheral recess segments the bonding structure by creating a localized weak point at the periphery of the semiconductor die. This segmentation allows the bonding structure to remain intact in the bulk while enabling controlled separation at the recess location, facilitating removal of poorly stacked dies without compromising overall bonding integrity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The recess creates a local quality change in the bonding structure by introducing a region with reduced bonding strength at the periphery. This local modification allows differential bonding characteristics - strong bonding in the central region for stable stacking, and weak bonding at the peripheral recess for easy removal of misaligned dies.

Inventive Principle:
Principle #3Local quality

2Ease of repair

If peripheral recesses are introduced to enable mechanical debonding, then poorly stacked dies can be removed, but the bonding structure thickness must be significantly less than the recess depth

Engineering Contradiction:
Improvemechanical debonding capabilityVSAvoidbonding structure thickness control
Core Design Contradiction:
Ease of repairVSManufacturing precision

Solution Approach 1:

The recess is formed in advance during die preparation, creating a pre-defined depth reference that guides the bonding process. This preliminary action ensures that the bonding structure thickness naturally remains less than the recess depth, as the bonding material fills only the available space, eliminating the need for precise thickness control during bonding.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The recess acts as an intermediary feature that mediates between the bonding structure and the removal mechanism. By providing a depth greater than the bonding structure thickness, the recess serves as a receptacle for pick device tips, enabling mechanical debonding without requiring precise control of bonding thickness.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Ease of operation

If the recess depth is made at least ten times greater than the bonding structure thickness, then pick device tips can be effectively inserted for debonding, but the substrate requires additional material removal

Engineering Contradiction:
Improvepick device insertion effectivenessVSAvoidsubstrate processing complexity
Core Design Contradiction:
Ease of operationVSEase of manufacture

Solution Approach 1:

The recess depth parameter is specifically designed to be at least ten times greater than the bonding structure thickness. This parameter change creates sufficient clearance for pick device tips to engage and lever effectively, transforming the mechanical debonding process from difficult to easy while maintaining manufacturability through standard etching or milling processes.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20240047424A1Semiconductor dies including recesses for facilitating mechanical debonding, and associated systems and devices
Publication Date: 2024.02.08 MICRON TECHNOLOGY INC
  • US20240047424A1 patent drawing
  • US20240047424A1 patent drawing
  • US20240047424A1 patent drawing

AI summary

Semiconductor dies and devices, such as memory dies and devices, and associated systems and methods, are disclosed herein. A representative semiconductor die comprises a substrate including a first surface, a second surface opposite the first surface, a perimeter, and a recess formed into the first surface adjacent to the perimeter. The recess has a depth in a direction extending between the first surface and the second surface. The semiconductor die further comprises a first bonding structure on the first surface and a second bonding structure on the second surface. The first bonding structure has a thickness, and the depth is at least ten times greater than the thickness. The recess can facilitate mechanical debonding of the semiconductor die during a manufacturing process that includes stacking the semiconductor die within a semiconductor device package.