Die Screening Diagnostics Using Defect-Test Correlation

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Solution Overview

Problem

Existing die screening systems face challenges in accurately identifying latent reliability defects and maintaining performance over time, leading to potential false negatives and increased labor costs for manual checks.

Innovation Solution

A screening system that includes a controller communicatively coupled to sample analysis tools, capable of identifying defect and electrical test results, generating correlation metrics, and determining diagnoses of the screening system's performance based on these metrics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual checks are performed to verify screening system accuracy, then defect detection accuracy is improved, but labor costs and time consumption increase

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidtime for manual checks
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The screening system performs self-diagnosis by automatically correlating its own defect inspection results with electrical test results, eliminating the need for external manual verification. The system monitors its own performance metrics and identifies deviations autonomously, allowing continuous operation without periodic manual intervention while maintaining detection accuracy.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system establishes a feedback loop where electrical test results are correlated with defect inspection data to continuously monitor screening system performance. This feedback mechanism enables real-time detection of performance deviations and triggers automatic alerts when calibration drift or accuracy issues are detected, replacing manual checks with automated continuous monitoring.

Inventive Principle:
Principle #23Feedback

2Productivity

If screening system operates without continuous verification, then productivity increases, but reliability of defect detection decreases

Engineering Contradiction:
Improvethroughput of screening systemVSAvoidreliability of defect detection
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system performs preliminary correlation analysis between defect inspection data and electrical test results continuously in the background during normal operation. By pre-establishing performance baselines and monitoring trends before critical failures occur, the system maintains reliability without requiring production stoppages for verification, enabling continuous high-speed screening with assured detection accuracy.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If correlation analysis is performed continuously, then performance monitoring accuracy is improved, but computational resources and system complexity increase

Engineering Contradiction:
Improveperformance monitoring accuracyVSAvoidcomplexity of analysis system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system extracts only the essential correlation metrics from the full dataset - specifically focusing on key performance indicators such as defect detection rates and false positive/negative rates - rather than analyzing all raw data continuously. This selective extraction approach maintains high monitoring accuracy while minimizing computational overhead and system complexity by concentrating on critical performance parameters.

Inventive Principle:
Principle #2Taking out (Extraction)

Data Source

PatentUS12332182B2System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data
Publication Date: 2025.06.17 KLA CORP
  • US12332182B2 patent drawing
  • US12332182B2 patent drawing
  • US12332182B2 patent drawing

AI summary

Systems and methods for determining a diagnosis of a screening system are disclosed. Such systems and methods include identifying defect results based on inline characterization tool data, identifying electrical test results based on electrical test data, generating one or more correlation metrics based on the defect results and the electrical test results, and determining at least one diagnosis of the screening system based on the one or more correlation metrics, the diagnosis corresponding to a performance of the screening system.