Inorganic Dielectric Bonding for Uniform-Temperature ESC Assemblies
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Solution Overview
Problem
Existing substrate processing technologies face challenges in achieving uniform temperature control and stability due to non-homogeneous construction of electrostatic chucks (ESCs), leading to local hot and cold spots and non-uniform processing results, particularly during high-temperature processes.
Innovation Solution
The use of inorganic dielectric bonding to combine ESC and heater plates made from dielectric materials like ceramic or glass, with electrodes embedded within, allows for precise temperature control and electrical insulation, while withstanding high temperatures and plasma erosion, using materials with matched thermal expansion coefficients to prevent deformations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional electrostatic chucks are used for substrate holding, then substrate can be held securely during processing, but non-uniform temperature distribution occurs leading to local hot and cold spots
Solution Approach 1:
The electrostatic chuck is divided into multiple independent heating zones with separate temperature control, allowing each zone to be optimized independently to eliminate hot and cold spots while maintaining secure substrate holding
Solution Approach 2:
The temperature distribution parameters are changed by implementing independent temperature control for different zones, transforming the uniform temperature approach into a multi-parameter temperature control system that eliminates thermal non-uniformity
2Reliability
If inorganic dielectric bonding is used to combine plates, then electrical insulation and high temperature resistance are improved, but manufacturing complexity increases
Solution Approach 1:
Multiple functional plates (ESC plate, heater plate, cooling plate) are merged into a single integrated structure through inorganic dielectric bonding, combining electrical insulation, heating, and cooling functions while withstanding high temperatures and plasma erosion
Solution Approach 2:
The structure uses composite materials bonded together through inorganic dielectric bonding, combining the advantages of different materials (dielectric properties, thermal conductivity, mechanical strength) to achieve reliable electrical insulation and plasma erosion resistance
3Adaptability or versatility
If materials with different thermal expansion coefficients are used in the chuck structure, then functional requirements are met, but thermal deformations occur at high temperatures
Solution Approach 1:
The design explicitly considers thermal expansion effects by selecting materials with matched thermal expansion coefficients or designing compensation mechanisms that prevent structural deformation during thermal cycling at high temperatures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach ensures uniform temperature control and stable substrate holding, preventing damage and non-uniform processing, even at high temperatures, by providing electrical insulation and resistance to plasma erosion.
Implementation Method 1
an inorganic dielectric bond including an inorganic dielectric material disposed between the first plate and the second plate
Implementation Method 2
An electrostatic chuck (ESC) is a device that can generate electrostatic force to securely hold a substrate (e.g., wafer) in place against a puck
Implementation Method 3
a cooling plate coupled to the substrate support, the cooling plate including a set of cooling channels
Implementation Method 4
withstanding high temperatures and plasma erosion
Data Source
AI summary
A device includes a first plate including a first dielectric material and having a first set of electrodes embedded therein, a second plate including a second dielectric material and having a second set of electrodes embedded therein, and an inorganic dielectric bond including an inorganic dielectric material disposed between the first plate and the second plate. The first plate and the second plate are disposed on a base structure.


