Dielectric Capacitors With Conductive Oxide Insertion Layers
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Solution Overview
Problem
High-performance ceramic dielectric capacitors face challenges with catastrophic breakdown due to material defects and electrical stresses, limiting their reliability and energy density for power electronic applications.
Innovation Solution
Embedding thin conductive oxide layers within the ceramic dielectric material matrix to redistribute trapped charge and prevent the propagation of defects, thereby increasing dielectric breakdown strength and capacitance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If thin ceramic films are deposited to increase capacitance density, then energy density improves, but dielectric breakdown strength decreases due to increased electrical stress concentration
Solution Approach 1:
The dielectric layer is segmented into multiple sub-layers separated by conductive oxide insertion layers. These insertion layers divide the continuous dielectric into discrete segments, preventing breakdown propagation across the entire thickness and allowing thinner total dielectric while maintaining reliability
Solution Approach 2:
Conductive oxide insertion layers are introduced as intermediary elements between the electrodes and dielectric layers. These layers act as mediators that redistribute electrical stress and prevent direct field concentration at defect sites, enabling thinner dielectric films with improved breakdown strength
2Ease of manufacture
If conventional fabrication processes are used to manufacture capacitors, then manufacturing simplicity is maintained, but material defects and micro cracks cause dielectric breakdown
Solution Approach 1:
Conductive oxide insertion layers are deposited beforehand between the dielectric layers during the fabrication process. This preliminary action prevents future breakdown propagation by establishing protective barriers before defects can cause catastrophic failure
Solution Approach 2:
The capacitor structure uses composite materials combining ceramic dielectric layers with conductive oxide insertion layers. This composite approach leverages the high permittivity of ceramics while using the conductive oxide to prevent breakdown, achieving both manufacturability and reliability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The embedded conductive oxide layers effectively block and dissipate electrical breakdown channels, enhancing the dielectric breakdown strength and reducing the risk of catastrophic failure, leading to improved performance and reliability of ceramic film capacitors.
Implementation Method 1
embedding a thin conductive oxide layer within the matrix of ceramic dielectric materials... redistribute the trapped charge over a larger cross-sectional area to reduce mechanical strain
Implementation Method 2
The embedded conductive oxide layers effectively block and dissipate electrical breakdown channels
Data Source
AI summary
The invention is directed to a process for making a dielectric ceramic film capacitor and the ceramic dielectric laminated capacitor formed therefrom, the dielectric ceramic film capacitors having increased dielectric breakdown strength. The invention increases breakdown strength by embedding a conductive oxide layer between electrode layers within the dielectric layer of the capacitors. The conductive oxide layer redistributes and dissipates charge, thus mitigating charge concentration and micro fractures formed within the dielectric by electric fields.