Dielectric Resonating Test Contactor for 100 GHz Signal Bandwidth
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Solution Overview
Problem
Current test contactors embedded in integrated circuit test systems have insufficient bandwidth to transmit test signals at high frequencies required for testing high-frequency analog or digital integrated circuits, necessitating a solution that enhances signal transmission capabilities.
Innovation Solution
A test contactor comprising two or more dielectric layers with a test probe embedded within, featuring an input signal port and an output signal port, where at least one dielectric layer has a medium or high dielectric constant, and optionally including a ground-signal or ground-signal-ground probe contact configuration, to improve signal transmission across the dielectric stack.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a single dielectric material is used in the test contactor, then the manufacturing process is simple, but the bandwidth is insufficient for high-frequency testing
Solution Approach 1:
The patent employs a composite dielectric structure consisting of multiple dielectric layers with different dielectric constants. Specifically, it uses a first dielectric layer with a first dielectric constant and a second dielectric layer with a second dielectric constant that is different from the first. This composite material approach enables the test contactor to achieve sufficient bandwidth for high-frequency testing while maintaining manufacturability through standardized layer deposition processes.
2Speed
If multiple dielectric layers with different dielectric constants are used, then the bandwidth increases for high-frequency testing, but the device complexity increases
Solution Approach 1:
The patent applies local quality by assigning different dielectric constants to specific layers within the dielectric stack. The first dielectric layer has a first dielectric constant optimized for certain frequency ranges, while the second dielectric layer has a second dielectric constant optimized for other frequency ranges. This localized optimization of material properties enables broadband performance without requiring a complete redesign of the entire structure.
Solution Approach 2:
The patent utilizes parameter changes by varying the dielectric constant parameter across different layers. By selecting dielectric materials with specific constant values for each layer, the structure achieves impedance matching and resonance characteristics that extend the operational bandwidth. The thickness and material composition of each layer are carefully controlled to achieve the desired frequency response.
3Speed
If the dielectric layers are optimized for radio frequency performance, then the bandwidth improves, but the mechanical robustness may be compromised
Solution Approach 1:
The patent employs composite materials that balance electrical and mechanical properties. The dielectric layers are constructed using materials that provide both the required dielectric constant for RF performance and sufficient mechanical strength for robustness. The multi-layer composite structure distributes mechanical stresses across multiple interfaces, enhancing overall structural integrity while maintaining the electrical characteristics needed for high-frequency operation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The proposed solution significantly increases bandwidth, achieving improved radio frequency performance, mechanical robustness, and manufacturing efficiency, enabling effective testing of integrated circuits with frequencies up to one hundred gigahertz while maintaining low insertion loss and reflection.
Implementation Method 1
The test probe includes an input signal port and an output signal port and the test probe to transmit a test signal from the input signal port to the output signal port
Implementation Method 2
one of the two or more dielectric layers includes a material having a low dielectric constant
Data Source
AI summary
A test contactor is disclosed. The test contactor includes two or more dielectric layers and a test probe embedded in the one or more dielectric layers. The test contactor traverses the one or more dielectric layers. The test probe to include an input signal port and an output signal port and the test probe to transmit a test signal from the input signal port to the output signal port.