Dielectric Layer Permittivity and Thickness Measurement
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Solution Overview
Problem
Current methods for characterizing layers close to a pipeline wall, such as those formed by wax, hydrates, and scale deposits, fail to accurately determine layer thickness and permittivity simultaneously, often requiring prior knowledge of one parameter or being limited by sensor sensitivity and penetration depth.
Innovation Solution
A system and method using electromagnetic sensors that operate in two frequency ranges to measure the complex reflection coefficient, allowing for simultaneous estimation of layer thickness and permittivity, employing models to derive additional properties like water conductivity and hydrate content from the measured permittivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single sensor is used for measurement, then device complexity is reduced, but measurement precision deteriorates because it cannot determine both thickness and permittivity simultaneously
Solution Approach 1:
The patent applies parameter changes by utilizing electromagnetic waves at two different frequency ranges (first frequency range and second frequency range) to enable a single sensor to determine both layer thickness and permittivity simultaneously. The complex reflection coefficient is measured at these different frequencies, and through frequency-dependent analysis, both parameters are extracted without requiring multiple sensors.
2Measurement precision
If prior knowledge of permittivity is assumed, then measurement precision of thickness improves, but adaptability deteriorates
Solution Approach 1:
The patent eliminates the need for prior knowledge of permittivity by measuring the complex reflection coefficient at two different frequency ranges. The permittivity is calculated from the frequency-dependent measurements, enabling the system to adapt to different materials (wax, hydrates, scale, asphaltenes) without requiring pre-programmed material properties.
3Length of stationary object
If sensor penetration depth is increased, then measurement capability for thicker layers improves, but device complexity increases
Solution Approach 1:
The patent uses frequency-range dependency to extend measurement capability for thicker layers without increasing physical sensor penetration depth. By measuring at a second frequency range where waves penetrate deeper and analyzing the frequency dependence of the complex reflection coefficient, the system can characterize layers thicker than the sensor's reactive sensitivity depth would normally allow.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate characterization of layer thickness and fluid properties, including water and hydrate content, even for layers thicker than the sensor's reactive sensitivity depth, using a single probe and reducing complexity and cost, while applicable to both stationary and flowing fluids.
Implementation Method 1
measuring a parameter in a first frequency range, measuring a parameter in a second frequency range
Implementation Method 2
A system and method using electromagnetic sensors that operate in two frequency ranges to measure the complex reflection coefficient
Implementation Method 3
estimating a permittivity in the first frequency range from the measured parameter in the first frequency range, estimating a permittivity in the second frequency range
Data Source
Figure 1a~1d
Figure 2a~3
Figure 4a~4b
AI summary
A system and method that permits measuring properties and thickness of a dielectric layer, particularly a dielectric layer close to a pipeline wall, and more particularly fluids flowing inside a pipe is provided. The present invention attains the above described objective by a system comprising a sensor operating in a material characterization mode in a first frequency range and a sensor operating in a thickness characterization mode in a second frequency range, and a method for operating said system.