Dielectric Constant Measurement Using Calibration Standards

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Solution Overview

Problem

Existing dielectric constant measurement methods using coaxial probes require advanced technical skills or measurement jigs for calibration, and involve increased device size when measuring liquid samples due to temperature measurement requirements.

Innovation Solution

A dielectric constant measurement method utilizing a dielectric spectroscopy sensor that calculates the dielectric constant of a target object by acquiring admittances and reflection coefficients of calibration standards and the target object, eliminating the need for advanced technical skills and reducing device size.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a metal plate is used for measuring S11 parameter of calibration standard, then measurement precision is improved, but device complexity increases due to requirement of measurement jig and advanced technical skill

Engineering Contradiction:
ImproveS11 parameter measurement precisionVSAvoidmeasurement device complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the calibration standard measurement function from the main measurement system. By using a separate calibration standard with known S11 parameters, the system eliminates the need for complex measurement jigs and advanced technical skills during actual measurements. The calibration standard is measured once during setup, and its known values are stored for later use in calculating the dielectric constant of unknown samples.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent creates a virtual copy of the calibration standard measurement process. Instead of physically measuring multiple calibration standards during each measurement session, the system uses pre-measured and stored S11 parameter values of calibration standards (air, metal plate, water) as reference data. This allows the system to perform accurate measurements without repeatedly requiring precise physical calibration setups.

Inventive Principle:
Principle #26Copying

2Measurement precision

If liquid sample is used for measuring S11 parameter, then measurement precision is improved, but device complexity increases due to temperature sensor requirement

Engineering Contradiction:
ImproveS11 parameter measurement precisionVSAvoiddevice size
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent performs temperature measurement and calibration standard measurement during the initial setup phase rather than during actual sample measurement. The temperature at the time of measuring calibration standards is recorded and stored. During subsequent measurements, this pre-recorded temperature data is used to calculate the dielectric constant without requiring active temperature sensors or real-time temperature monitoring during sample measurement.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent introduces temperature as an intermediary parameter that is measured once during calibration setup and then used as a fixed value for subsequent measurements. Instead of continuously monitoring temperature during each measurement, the system uses the temperature value recorded during calibration (when the probe was in contact with the calibration standard) as the reference temperature for calculating the dielectric constant of liquid samples.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If coaxial probe is used for dielectric constant measurement, then measurement precision is improved, but ease of operation deteriorates due to requirement of advanced technical skill

Engineering Contradiction:
Improvedielectric constant measurement precisionVSAvoidoperation simplicity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent enables the measurement system to perform self-calibration using built-in calibration standards (air, metal plate, water) that come with the device. The system automatically measures S11 parameters of these calibration standards during setup and stores the data for use in calculating the dielectric constant of unknown samples. This eliminates the need for operators to manually perform complex calibration procedures or use external measurement jigs.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent introduces calibration standards as intermediary reference objects that simplify the measurement process. By measuring S11 parameters of calibration standards with known dielectric constants and storing these values, the system creates a reference database that automatically compensates for probe characteristics. This allows operators to simply place the probe against the sample and press a button, while the system handles the complex calibration calculations in the background.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables easy and accurate measurement of dielectric constants without requiring advanced technical skills or additional measurement devices, such as jigs or temperature sensors, thereby simplifying the measurement process and reducing device size.

Implementation Method 1

measuring a first reflection coefficient of the first calibration standard

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 2

a technique in which a complex dielectric constant is calculated according to dielectric spectroscopy

Methodology Applied
Scientific EffectDielectric spectroscopy: Dielectric Permittivity

Data Source

PatentUS20250189473A1Permittivity Measurement Method, Permittivity Measurement System, Permittivity Measurement Program
Publication Date: 2025.06.12 NIPPON TELEGRAPH & TELEPHONE CORP
  • US20250189473A1 patent drawing
  • US20250189473A1 patent drawing
  • US20250189473A1 patent drawing

AI summary

A method includes the steps of acquiring an admittance of a calibration standard of which a dielectric constant is known, measuring a first reflection coefficient, calculating an open reflection coefficient in an ideal open state of a dielectric spectroscopy sensor on the basis of the first reflection coefficient and the admittance of the calibration standard when the calibration standard is installed on a measurement end surface, calculating a reflection coefficient of another calibration standard other than the first calibration standard on the basis of the open reflection coefficient and an admittance of the another calibration standard, measuring a reflection coefficient of a target object, and calculating a dielectric constant of the target object on the basis of the first reflection coefficient, the reflection coefficient of the another calibration standard, the reflection coefficient of the target object, the admittance of the first calibration standard, and the admittance of the another calibration standard.