Dielectric Platform With Sealed Voids For Parasitic Capacitance Reduction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
In high-frequency or RF applications, passive devices integrated with conductive substrates suffer from low quality factors and reduced operational frequencies due to parasitic capacitive coupling, necessitating semiconductor structures with reduced parasitic capacitances and increased isolation.
Innovation Solution
A semiconductor structure featuring a dielectric platform with sealed voids and dielectric materials, fabricated using orientation-dependent etching to minimize dielectric constant and parasitic capacitance, providing electrical isolation and increased operational frequencies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If passive devices are formed on conductive substrates, then integration is achieved, but parasitic capacitive coupling increases and quality factor decreases
Solution Approach 1:
A dielectric platform is introduced as an intermediary layer between the conductive substrate and the passive devices. This dielectric platform with sealed voids acts as a mediator that reduces parasitic capacitive coupling while maintaining the integration benefit, thereby improving the quality factor of passive devices without sacrificing integration capability.
2Productivity
If passive devices are formed close to conductive substrate, then device density increases, but operational frequency is reduced due to parasitic capacitance
Solution Approach 1:
The dielectric platform serves as an intermediary that enables passive devices to be positioned close to the conductive substrate while maintaining high operational frequencies. The sealed voids within the dielectric platform minimize parasitic capacitance, allowing high device density without the usual penalty of reduced operational frequency.
3Reliability
If dielectric constant is reduced to minimize parasitic capacitance, then parasitic capacitance decreases, but dielectric material selection and fabrication complexity increase
Solution Approach 1:
The dielectric platform incorporates sealed voids that create a porous structure with reduced effective dielectric constant. This approach minimizes parasitic capacitance while using standard semiconductor fabrication processes, avoiding the need for exotic dielectric materials or overly complex fabrication sequences.
Solution Approach 2:
The dielectric platform is formed as a composite structure combining dielectric material with sealed voids. This composite approach achieves the desired low effective dielectric constant for minimizing parasitic capacitance while remaining compatible with existing semiconductor manufacturing capabilities.
4Reliability
If isolation between regions is increased, then parasitic capacitance decreases, but structural complexity and manufacturing difficulty increase
Solution Approach 1:
The dielectric platform is formed as a segmented structure with sealed voids that provide electrical isolation between different regions. This segmentation approach achieves effective isolation while using standard photolithography and etching processes, avoiding the need for complex multi-layer isolation structures.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The dielectric platform reduces parasitic capacitance, enhances the quality factor of passive devices, and increases operational frequencies while maintaining structural integrity and reducing thermal stress.
Implementation Method 1
An embedded dielectric platform may be formed in a semiconductor substrate. The dielectric platform may have a first portion below a surface of the semiconductor substrate and a second portion above the surface of the semiconductor substrate.
Data Source
AI summary
In various embodiments, semiconductor structures and methods to manufacture these structures are disclosed. In one embodiment, a method includes removing a portion of a semiconductor material using an orientation-dependent etch to form a first cavity, a second cavity, wherein the first cavity is isolated from the second cavity, a first protrusion is between the first cavity and the second cavity, and the semiconductor material comprises silicon. The method further includes performing a thermal oxidation to convert a portion of the silicon of the semiconductor material to silicon dioxide and forming a first dielectric material over the first cavity, over the second cavity, over at least a portion of the semiconductor material, and over at least a portion of the first protrusion. Other embodiments are described and claimed.


