Dielectric Probe with Bulbous Tip for Curved Surfaces
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Solution Overview
Problem
Existing dielectric measurement probes struggle with accurately measuring dielectric properties of materials with concave or convex surfaces due to air gaps and require time-consuming computer modeling for non-standard sizes and shapes.
Innovation Solution
A dielectric measurement probe with a bulbous tip and calibration saddle that allows contact with varying surfaces, including concave or convex surfaces, using a center electrode, side electrodes, and a mounting harness, enabling non-destructive measurement of complex relative dielectric permittivity without air gaps and maintaining measurement accuracy in tilted positions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a standard coaxial probe is used on curved dielectric surfaces, then the probe structure is simple and manufacturing is easy, but air gaps form between the probe and the surface resulting in measurement errors
Solution Approach 1:
The probe tip is designed with a spherical bulbous shape that can conform to curved dielectric surfaces. This curvature allows the probe to maintain contact with convex and concave surfaces without forming air gaps, thereby improving measurement accuracy while keeping the overall probe structure relatively simple.
Solution Approach 2:
The mounting harness incorporates adjustable mechanical arms with local adjustment capabilities that allow the probe tip to be positioned and angled precisely. This local adjustability enables the probe to adapt to varying surface geometries and maintain optimal contact without requiring complete redesign of the entire probe structure.
2Measurement precision
If computer modeling methods are used to account for air gaps, then measurement accuracy can be improved, but the process becomes time-consuming and complex
Solution Approach 1:
The probe incorporates a calibration saddle and adjustable mechanical arms that allow for preliminary adjustment and calibration before measurement. This preliminary mechanical adjustment eliminates the need for time-consuming computer modeling to compensate for air gaps, as the probe is pre-adjusted to maintain optimal contact with the surface.
3Adaptability or versatility
If the probe is designed to contact varying surfaces, then adaptability to different geometries is improved, but the device complexity increases
Solution Approach 1:
The spherical bulbous tip design provides inherent adaptability to curved surfaces through its geometric shape, allowing contact with both convex and concave geometries without requiring complex active adjustment mechanisms.
Solution Approach 2:
The mechanical arms are designed with adjustable degrees of freedom that allow dynamic positioning and angling of the probe tip. This dynamic adjustability enables the probe to adapt to varying surface geometries while maintaining a relatively simple overall structure compared to fully automated or rigid systems.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The probe effectively measures dielectric properties on curved surfaces by adjusting the reference plane and determining the depth of electric field penetration, providing accurate results for materials like antenna radomes, building materials, and soil, without the need for complex modeling.
Implementation Method 1
The voltage wave generated by a vector network analyzer is guided between the electrodes, toward the bulbous tip and into the dielectric material
Implementation Method 2
non-destructive measurement of the complex relative dielectric permittivity of the material
Implementation Method 3
The bulbous tip includes a surface area for improved measurement sensitivity
Implementation Method 4
The material under test reflects the incoming voltage wave back to the network analyzer with the ratio of the reflected and forward voltages forming a reflection coefficient
Data Source
AI summary
A probe is provided for measuring permittivity of a dielectric material. The probe includes side electrodes and a pivotable center electrode with a bulbous tip to contact the material. A mounting harness supports the side electrodes and a feed connector with the center electrode soldered to the connector. The tip includes a contoured surface for measurement and rotation on the material. The bulbous tip can rest perpendicularly or in a pivoted position on the material without a loss of measurement accuracy. A saddle ensures that a measurement of the reflection coefficient is near the bulbous tip. In use, a voltage wave generated by a vector network analyzer is guided between the electrodes toward the tip and into the material. The material reflects this voltage wave back to the analyzer. The ratio of the reflected and forward voltages forms a reflection coefficient as a baseline for measuring permittivity.