Dielectric Probe for Millimeter-Wave Measurement
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Solution Overview
Problem
Current methods for measuring and characterizing millimeter-wave and terahertz dielectric waveguides face challenges due to high power loss from multiple mode transitions and mechanical precision issues, especially with existing ground-signal-ground probes that require two mode transitions and are not suitable for high-frequency testing.
Innovation Solution
A probe design that minimizes mode transitions by using a tapered face with total internal reflection, where the probe is attached to a housing block with a prong and connector, allowing for planar contact and efficient signal transfer with minimal loss, and is made from materials transparent to microwave to optical radiation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If ground-signal-ground probes are used for mmW and THz measurement, then commercial availability and ease of use are improved, but power loss increases due to multiple mode transitions
Solution Approach 1:
The patent extracts and eliminates the unnecessary mode transition interface by directly coupling the dielectric waveguide probe to the E11x or E11y mode of the dielectric waveguide, removing the intermediate TEM mode conversion stage that causes power loss in traditional GSG probes
Solution Approach 2:
The probe design achieves multi-functionality by maintaining compatibility with both TE10 mode sources and E11x/E11y mode dielectric waveguides through a single transition interface, eliminating the need for separate mode converters while reducing overall system complexity
2Reliability
If traditional probes are used for high-frequency testing, then mechanical precision requirements are relaxed, but electrical reliability and low-loss transmission deteriorate
Solution Approach 1:
The patent changes the fundamental operating parameters by using dielectric materials with appropriate permittivity values and designing the probe geometry to support total internal reflection, enabling reliable high-frequency transmission without requiring extremely tight mechanical tolerances
Solution Approach 2:
The probe utilizes composite dielectric structures that combine materials with complementary properties to achieve both mechanical stability and electromagnetic performance, allowing reliable operation at mmW and THz frequencies while maintaining manufacturability
3Loss of energy
If mode transitions are reduced in the measurement system, then power loss is reduced, but device complexity increases
Solution Approach 1:
The patent merges the probe structure and waveguide interface into a single integrated component, combining the functions of mode conversion, signal transmission, and mechanical positioning into one unified structure that reduces overall system complexity while minimizing power loss
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The probe design significantly reduces power loss and mechanical stress, enabling accurate characterization of dielectric waveguides across a range of frequencies with improved mechanical reliability and ease of integration.
Implementation Method 1
the angle maintains a 'total internal reflection' effect for waves propagating through the probe
Data Source
AI summary
A probe includes a first rod having a first axis and a second rod having a second axis. A first end of the first rod is connected to a first end of the second rod to form an angle that maintains a “total internal reflection” effect for waves propagating through the probe. A second end of the second rod includes a prong facilitating attachment of the probe to a housing block. The first axis and the second axis define a plane. A second end of the first rod includes a tapered face formed perpendicular to the plane. The tapered face is sufficiently flat to make planar contact with a portion of a component under study. A support is formed in the plane and connected to the second rod. A second end of the support includes a connector to facilitate attachment of the probe to the housing block.