Dielectric-Tether Coupon Wafer for Cleaner Micro-Transfer Printing

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Solution Overview

Problem

Conventional chip bonding processes for integrating III-V semiconductor devices with silicon-on-insulator (SOI) platforms are costly and have low yield due to metal bumping requirements and alignment challenges, necessitating an improvement in micro-transfer printing (MTP) techniques.

Innovation Solution

A coupon wafer with a tether made of dielectric material is used in micro-transfer printing, which simplifies the attachment and detachment of III-V semiconductor devices, reducing residue and improving yield by altering breaking mechanics and alignment requirements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If flip-chip bonding is used for integrating III-V semiconductor devices with SOI platforms, then device integration is achieved, but manufacturing cost increases and yield decreases due to metal bumping requirements and alignment challenges

Engineering Contradiction:
Improveintegration reliabilityVSAvoidmanufacturing yield
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The device coupon is segmented from the substrate using a sacrificial layer, allowing independent handling and transfer. This segmentation enables the coupon to be released and transferred without requiring complex metal bumping processes, thereby improving yield while maintaining integration reliability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A sacrificial layer acts as an intermediary between the device coupon and substrate. This intermediary enables controlled release of the coupon through selective etching, eliminating the need for metal bumping and complex alignment procedures, thus improving manufacturing yield

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If flip-chip bonding is used for integrating III-V semiconductor devices with SOI platforms, then device integration is achieved, but manufacturing cost increases due to metal bumping requirements

Engineering Contradiction:
Improveintegration reliabilityVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The metal bumping step is extracted and eliminated from the process. Instead of using metal bumps for bonding, the invention uses direct bonding of the released device coupon to the SOI platform, significantly reducing manufacturing cost while maintaining integration reliability

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The sacrificial layer is a temporary, disposable structure used only during fabrication. It enables coupon release and is subsequently removed, providing a low-cost pathway to achieve reliable device integration without expensive metal bumping

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

3Ease of manufacture

If photoresist tethers are used in micro-transfer printing, then device attachment is achieved, but yield decreases due to inconsistent application and residue during printing

Engineering Contradiction:
Improveapplication simplicityVSAvoidprinting yield
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The tether material is changed from photoresist to dielectric material. This parameter change provides more consistent application characteristics and eliminates residue issues during printing, thereby improving yield while maintaining ease of manufacture

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The tether is formed as a composite structure with dielectric material providing consistent mechanical properties and clean release characteristics. This composite approach maintains application simplicity while eliminating the residue problems that reduce printing yield

Inventive Principle:
Principle #40Composite materials

4Ease of operation

If conventional alignment procedures are used in micro-transfer printing, then alignment is achieved, but alignment precision decreases due to three-dimensional alignment requirements

Engineering Contradiction:
Improvealignment easeVSAvoidalignment precision
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The alignment problem is reduced from three-dimensional to two-dimensional by predetermining vertical alignment through the coupon structure. This dimensional reduction significantly improves alignment precision while maintaining ease of operation during the transfer process

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20240241317A9Coupon wafer and method of preparation thereof
Publication Date: 2024.07.18 ROCKLEY PHOTONICS LTD
  • US20240241317A9 patent drawing
  • US20240241317A9 patent drawing
  • US20240241317A9 patent drawing

AI summary

A coupon wafer comprising a device coupon (110) for use in a micro-transfer printing process used to fabricate an optoelectronic device. The coupon wafer includes a wafer substrate (124), and the device coupon (110) is attached to the wafer substrate via a tether (122) and the tether (122) is formed from a dielectric material.