Differential Clock Correction Circuit for Stable Memory Timing
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Solution Overview
Problem
Existing semiconductor devices face challenges in generating an internal differential clock with proper duty cycle correction for high-speed data transfer in semiconductor memory systems, leading to potential data errors due to duty cycle distortion and unstable intermediate node potentials.
Innovation Solution
Incorporating pull-up and pull-down circuits in the cross point correction circuit to stabilize intermediate nodes and generate differential clocks with corrected cross points, ensuring appropriate duty cycle and reducing warm-up cycles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If duty cycle correction is implemented in existing semiconductor devices, then data transfer reliability is improved, but circuit complexity increases and warm-up cycles are required
Solution Approach 1:
The patent combines the duty cycle correction function with the existing clock generation circuitry by integrating pull-up and pull-down circuits into the differential clock generation path. This merging approach enables duty cycle correction without adding completely separate correction circuits, thereby improving reliability while limiting the increase in overall device complexity.
Solution Approach 2:
The pull-up and pull-down circuits automatically adjust the clock edges to achieve proper duty cycle without requiring external control signals or warm-up cycles. The circuits self-regulate the clock waveform by actively pulling nodes to appropriate voltage levels, eliminating the need for preliminary warming periods and reducing operational complexity.
2Stability of the object's composition
If pull-up and pull-down circuits are added to stabilize intermediate nodes, then clock signal stability is improved, but power consumption increases
Solution Approach 1:
The pull-up and pull-down circuits operate in a periodic manner, activating only during critical transitions of the clock signal rather than continuously. This periodic operation stabilizes intermediate nodes during essential clock edges while minimizing power consumption by keeping the circuits inactive during stable periods, thus achieving node stability without excessive energy usage.
3Manufacturing precision
If cross point correction is implemented, then duty cycle accuracy is improved, but device area increases
Solution Approach 1:
The patent applies cross point correction locally at specific intermediate nodes within the differential clock generation circuit rather than throughout the entire device. By targeting only the critical nodes that affect duty cycle accuracy and inserting pull-up/pull-down circuits at these localized positions, the design achieves improved duty cycle precision while minimizing the overall device area increase.
Data Source
AI summary
According to one embodiment, in a semiconductor device, the first pull-up circuit is connected to a third node and to a fourth node. The third node is a node between a drain of the first transistor with a first conductivity type and a source of the second transistor with the first conductivity type. The fourth node is a node between a drain of the third transistor with the first conductivity type, and a source of the fourth transistor with the first conductivity type and a source of the fifth transistor with the first conductivity type. The first pull-down circuit is connected to a fifth node and to a sixth node. The fifth node is a node between a drain of the first transistor with a second conductivity type and a source of the second transistor with the second conductivity type. The sixth node is a node between a drain of the third transistor with the second conductivity type and a source of the fourth transistor with the second conductivity type and a source of the fifth transistor with the second conductivity type.