Differential Test Probe With Selectable Ground Pins

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Solution Overview

Problem

Existing printed wiring board test probes are difficult to maintain and replace, limiting their ability to test a wide range of signal patterns due to fixed signal and ground pin arrangements, and they often require manual calibration, which is time-consuming and prone to errors.

Innovation Solution

A differential test probe with a probe body and coaxial cables, featuring spring-loaded signal pins and selectively arranged ground pins, allowing for multiple signal-to-ground paths and automatic calibration verification, enabling efficient and versatile testing of high-frequency signals on printed wiring boards.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If signal and ground pins are fixed in arrangement, then manufacturing is simplified, but adaptability to test different signal patterns is reduced

Engineering Contradiction:
Improveprobe manufacturing simplicityVSAvoidsignal pattern testing capability
Core Design Contradiction:
Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The ground pins are made selectively arrangeable rather than fixed, allowing the probe to adapt to different signal patterns. The ground pins can be positioned at multiple locations relative to signal pins, enabling the same probe to test various differential signal configurations without requiring multiple specialized probes.

Inventive Principle:
Principle #15Dynamics

2Reliability

If entire probe is replaced when elements malfunction, then reliability is maintained, but loss of time and productivity are increased

Engineering Contradiction:
Improveprobe functionalityVSAvoidprobe replacement time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The probe is divided into replaceable modular components, specifically the ground pins can be independently replaced. When a ground pin malfunctions, only that specific pin needs to be replaced rather than the entire probe assembly, significantly reducing maintenance time and improving productivity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Individual ground pins are designed to be replaceable components that can be discarded when malfunctioning and replaced with new pins. This allows selective replacement of only the defective elements rather than the entire probe, recovering the functional portions of the probe for continued use.

Inventive Principle:
Principle #34Discarding and recovering

3Measurement precision

If manual calibration is performed, then measurement precision can be achieved, but loss of time and potential for errors increase

Engineering Contradiction:
Improvecalibration accuracyVSAvoidtesting efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The probe incorporates automatic calibration verification capability that performs calibration checks without requiring manual intervention. The system automatically verifies calibration status and performs necessary adjustments, eliminating the time-consuming manual calibration process while maintaining measurement precision through automated routines.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS7906979B2High frequency differential test probe for automated printed wiring board test systems
Publication Date: 2011.03.15 MAYO FOUNDATION FOR MEDICAL EDUCATION & RESEARCH
  • US7906979B2 patent drawing
  • US7906979B2 patent drawing
  • US7906979B2 patent drawing

AI summary

A differential test probe for a printed wiring board test system includes a probe body having a proximal end and a distal end. Each of a plurality of coaxial cables extending from the proximal end to the distal end. The plurality of coaxial cables each includes a center conductor having an axial aperture at the distal end. The differential test probe also includes a plurality of signal pins that are each mounted in the axial aperture of the center conductor of one of the plurality of coaxial cables to electrically couple the signal pin to the center conductor. A plurality of ground pins are coupled to the probe body and selectively arranged relative to the plurality of signal pins to provide multiple signal to ground paths between the plurality signal pins and the plurality ground pins.