Diffraction-Enlarged Particle Imaging for High-Speed Analysis
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Solution Overview
Problem
Conventional microscopy systems face limitations in measuring small particles in large sample volumes due to high magnification requirements, leading to small optical sampling volumes and long analysis times, which restricts the number of particles that can be analyzed efficiently.
Innovation Solution
A system using diffraction enlargement to increase the pixel count of particle images, allowing for accurate measurement of small particles with a lower magnification factor, which results in a larger optical sampling volume and faster analysis times.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high magnification is used to measure small particles, then measurement precision is improved, but optical sampling volume decreases and analysis time increases
Solution Approach 1:
The patent changes the optical parameters by using a lower magnification objective lens (e.g., 10x instead of 100x) combined with a camera with larger pixel elements or higher pixel density. This parameter change allows maintaining measurement precision while increasing the optical sampling volume and reducing analysis time, directly resolving the contradiction between measurement precision and productivity
2Measurement precision
If high magnification is used to measure small particles, then measurement precision is improved, but optical sampling volume decreases
Solution Approach 1:
The patent changes the magnification parameter to a lower value (e.g., 10x objective instead of 100x) while compensating by using a camera with larger pixel elements or higher pixel density. This parameter change increases the optical sampling volume by a factor of 100x (10x linear magnification difference squared) while maintaining adequate measurement precision through the camera's enhanced pixel capabilities
3Measurement precision
If high magnification is used to measure small particles, then measurement precision is improved, but the number of particles that can be analyzed decreases
Solution Approach 1:
The patent changes the magnification parameter to a lower value, which exponentially increases the field of view and allows analyzing many more particles in a single measurement. The precision is maintained through using a camera with larger pixel elements or higher pixel density that can still resolve small particle features at the lower magnification
4Productivity
If lower magnification is used to increase optical sampling volume, then productivity is improved, but measurement precision deteriorates
Solution Approach 1:
The patent changes the detection parameter by using a camera with larger pixel elements or significantly higher pixel density to compensate for the lower magnification. This allows the system to maintain adequate measurement precision while operating at lower magnification, thereby achieving both high productivity and acceptable measurement accuracy simultaneously
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the measurement of a larger number of particles in a single measurement with increased accuracy and speed, overcoming the limitations of conventional microscopy by using diffraction enlargement to enhance pixel count and optical sampling volume.
Implementation Method 1
imaging optics for causing a diffraction enlargement of images of the particles by at least 5 pixels each
Data Source
AI summary
A system and method for measuring small particles suspended in a fluid are disclosed. The system employs optical imaging using diffraction enlargement. A sample of small particles illuminated by a light source is imaged onto a pixel array of detector elements using an imaging optical system having a reduced magnification not sufficient for forming a large enough image of a smallest particle of interest. A low-aperture imaging optics with NA<0.05 is used to add diffraction enlargement to the image corresponding to at least 5 pixels to enable accurate measurement of images of smallest particles of interest, and to increase an optical sampling volume. Suitably programmed processor is used for determining at least a pixel count for each of the diffraction-enlarged images, and for generating a number, size or distribution of particles accounting for pre-determined diffraction enlargement of particle images of different sizes. The method enables analysis of large samples of small particles in one measurement.