Diffuse Reflectance Spectroscopy Infinity Focus
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing diffuse reflectance spectroscopy instruments face challenges in achieving consistent chemical composition predictions due to variability in instrument responses, sample positioning, illumination differences, and double modulation artefacts, leading to costly and time-consuming calibration processes.
Innovation Solution
The development of diffuse reflectance spectroscopy apparatus with a sample receiving location, illumination arrangement, and collection optics that focus light reflected by the sample at infinity, incorporating a half beam block to prevent double modulation, and a reference spectrum acquiring arrangement for improved measurement consistency and reduced calibration costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If each instrument is calibrated individually to achieve best measurement accuracy, then measurement precision is improved, but cost and time consumption increase prohibitively
Solution Approach 1:
The patent creates a standardized reference configuration that serves as a template for instrument setup. By copying this reference configuration across multiple instruments, the system achieves consistent measurements without requiring individual calibration of each instrument, thus reducing calibration time while maintaining measurement accuracy.
Solution Approach 2:
The patent modifies the optical configuration parameters (such as focusing reflected light at infinity rather than at the sample plane) to create an instrument design that is inherently less sensitive to positioning variations. This parameter change allows instruments to produce consistent results without individual calibration, reducing both time and cost.
2Reliability
If collection optics focus at the sample plane, then light collection efficiency is improved, but sensitivity to sample height variations increases
Solution Approach 1:
Instead of focusing the collected light at the sample plane (conventional approach), the patent inverts the optical configuration to focus at infinity. This reversal makes the system less sensitive to sample height variations while maintaining effective light collection, as parallel rays from different sample heights converge to the same focal point.
3Measurement precision
If standards are analyzed using wet chemistry techniques to build calibration models, then model accuracy is improved, but process complexity and cost increase
Solution Approach 1:
The patent extracts the essential calibration function from complex wet chemistry analysis and replaces it with a simplified optical measurement approach. By using the standardized instrument configuration to directly measure reference standards, the system builds calibration models without requiring cumbersome chemical analysis, thus reducing process complexity while maintaining model accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus achieves consistent and accurate chemical composition analysis by minimizing variability in instrument responses and illumination, reducing the need for frequent recalibration and improving measurement uniformity across different instruments.
Implementation Method 1
the collection optics focus the detector substantially at infinity
Implementation Method 2
incorporating a half beam block to prevent double modulation
Data Source
AI summary
Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location 2 for receiving a sample 3 for analysis; an illumination arrangement 4 for directing light towards a received sample; a detector 6 for detecting light reflected by a received sample; and collection optics 5 for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer 42 and a half beam block 45a, 45b which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam block 45a may be disposed in the optical path between the interferometer and the light source 41 for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block 45b may be disposed in the optical path on the opposite side of the interferometer than the light source.