Diffusion Nozzle Gas Flow for Substrate Temperature Uniformity
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Solution Overview
Problem
Existing liquid processing technologies face challenges in achieving uniform temperature distribution and preventing rippling or collapse of processing liquids on substrates during the development of resist films, leading to non-uniform resist patterns.
Innovation Solution
A liquid processing apparatus with a diffusion nozzle having multiple discharge openings at different angles is used to jet a cooling gas over a wide area of the substrate, including its central portion, while supplying processing liquids, which accelerates vaporization and minimizes the impact on the liquids, thereby maintaining uniform temperature and preventing rippling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If air is jetted onto the substrate to control temperature, then temperature distribution is improved, but rippling or collapse of processing liquid occurs
Solution Approach 1:
The gas supply device is divided into multiple nozzles with different orientations (first nozzles facing upward, second nozzles facing sideways). This segmentation allows the gas flow to be distributed in different directions, reducing the impact force on the processing liquid while maintaining temperature control effectiveness.
Solution Approach 2:
Different regions of the substrate receive gas flow from nozzles with different orientations. The first nozzles provide upward gas flow for overall temperature control, while the second nozzles provide sideways gas flow for localized cooling without directly impacting the processing liquid. This local differentiation resolves the contradiction between temperature control and liquid stability.
2Temperature
If gas flow rate is increased to improve vaporization and temperature control, then temperature uniformity is improved, but impact on processing liquid increases causing rippling
Solution Approach 1:
The gas supply system is segmented into first nozzles for overall temperature control and second nozzles for localized cooling. This allows the total gas flow rate to be distributed such that vaporization is enhanced without concentrating high-velocity impact on the processing liquid, thereby maintaining temperature uniformity while reducing harmful impact.
Solution Approach 2:
The second nozzles act as intermediaries that provide sideways gas flow to accelerate vaporization at the liquid-gas interface without directly impacting the bulk processing liquid. This intermediary approach enables improved temperature control while protecting the processing liquid from direct high-velocity impact that would cause rippling.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach ensures a more uniform temperature distribution across the substrate surface, reduces the risk of rippling or collapse of processing liquids, and allows for smooth execution of liquid processing operations.
Implementation Method 1
jet the gas from the diffusion nozzle onto a region of the front surface of the substrate including at least a central portion thereof in a state that the processing liquid is supplied on the front surface of the substrate
Implementation Method 2
accelerates vaporization and minimizes the impact on the liquids, thereby maintaining uniform temperature
Data Source
AI summary
A liquid processing apparatus includes a substrate holder configured to hold a substrate; a processing liquid supply configured to supply a processing liquid onto a front surface of the substrate; a gas supply configured to supply a gas onto the front surface of the substrate; and a controller. The gas supply includes a diffusion nozzle which is provided with multiple discharge openings respectively elongated at different angles with respect to the front surface of the substrate. The controller performs controlling the gas supply to jet the gas from the diffusion nozzle onto a region of the front surface of the substrate including at least a central portion thereof in a state that the processing liquid is supplied on the front surface of the substrate.


