Digital Chip Temperature Detection via Oscillating Gate Delay
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Solution Overview
Problem
Conventional temperature detecting systems for chips require complex analog circuits that occupy significant layout area and lack a specific method to measure gate delay time, which can lead to design errors if not physically measured.
Innovation Solution
A digital temperature detecting system utilizing a clock generator, oscillating circuit with odd-numbered NOT gates, and command processing units to generate clock signals and determine working temperature and gate delay time through counting durations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If an analog circuit is used for temperature detection, then temperature detection function is achieved, but layout area increases and circuit design becomes more complicated
Solution Approach 1:
The patent replaces the analog circuit system with a digital circuit system. Specifically, it substitutes the thermal diode and analog-to-digital converter with a digital temperature detection circuit that uses a timer, counter, and digital logic gates to directly measure temperature through digital signal processing, thereby eliminating the need for complex analog circuit design
Solution Approach 2:
The patent changes the measurement parameter from direct voltage/current measurement in analog circuits to frequency/time-based measurement in digital circuits. By measuring the oscillation frequency of an RC circuit or the charge/discharge time of a capacitor, the system converts temperature information into digital counts that can be processed by simple digital logic, reducing design complexity
2Reliability
If an analog circuit is used for temperature detection, then temperature detection function is achieved, but layout area increases
Solution Approach 1:
The patent replaces the analog circuit system with a digital circuit system. Specifically, it substitutes the thermal diode and analog-to-digital converter with a digital temperature detection circuit that uses a timer, counter, and digital logic gates to directly measure temperature through digital signal processing, thereby eliminating the need for complex analog circuit design
Solution Approach 2:
The patent extracts the temperature sensing function from the analog domain and implements it purely in the digital domain. By removing the thermal diode and analog signal conditioning circuits, the design eliminates large analog layout areas while retaining temperature detection capability through digital timing and counting mechanisms
3Productivity
If gate delay time is not physically measured, then design process is faster, but design errors may occur
Solution Approach 1:
The patent implements a self-measurement mechanism where the digital temperature detection circuit automatically measures its own gate delay time through internal timing and counting operations. The circuit uses a known reference frequency and counts the number of clock cycles corresponding to the gate delay, allowing the system to self-calibrate and compensate for timing errors without external intervention
Solution Approach 2:
The patent incorporates feedback by using the measured gate delay time to correct subsequent timing measurements. The system measures the gate delay at different temperatures, stores this calibration data, and uses it to compensate for temperature-dependent timing variations in real-time operations, ensuring accurate temperature readings throughout the operating range
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for efficient detection of chip working temperature and estimation of gate delay time, reducing layout area requirements and avoiding design mistakes by using digital circuits, thereby improving temperature monitoring and chip stability.
Implementation Method 1
a gate delay time in the chip can be further estimated through the digital temperature detecting system and method of this present invention
Data Source
AI summary
A digital temperature detecting system for detecting a working temperature of a chip. The digital temperature detecting system includes a clock generator, for generating a first clock signal having a constant frequency; an oscillating circuit having a plurality of Not gates coupled in series, for generating a second clock signal, wherein a total number of the Not gates is an odd number; a command issuing unit connected to the clock generator, for generating a reference command signal according to the first clock signal, wherein a counting duration and a recovery duration are generated periodically in the reference command signal; and a command processing unit connected to the command issuing unit and the oscillating circuit, for generating a counting number through counting the clocks generated in the second clock signal in the counting duration and determining a working temperature according to the counting number.