Digital Duty Cycle Adjustment Using TDC and Reduced Delay Stages
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Solution Overview
Problem
Conventional mechanisms for duty cycle adjustment in digital circuits, such as charge pumps and delay lines, face limitations in frequency range, power consumption, chip area efficiency, and noise generation, making them unsuitable for scalable and reliable pulse generation, especially in high-temperature environments.
Innovation Solution
A digital duty cycle adjustment system that utilizes a time-to-digital converter to measure and digitally adjust the duty cycle of input signals, employing a reduced number of delay stages, lower power consumption, and improved frequency response, while reducing chip area and noise, through a system comprising a time-to-digital converter, duty cycle index generator, input phase assignment generator, slave delay line, and duty cycle generator.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional charge pumps or delay lines are used for duty cycle adjustment, then duty cycle can be adjusted, but frequency range is limited and power consumption increases
Solution Approach 1:
The patent replaces conventional charge pump circuits and analog delay lines with a digital time-to-digital converter (TDC) based system. The TDC measures the input signal period digitally and generates adjustment signals based on duty cycle error, substituting analog mechanisms with digital processing to achieve wider frequency range and lower power consumption
Solution Approach 2:
The system dynamically adjusts the duty cycle by changing the pulse width parameter based on measured duty cycle error. The TDC converts time measurements into digital codes that control the pulse generator, enabling adaptive parameter changes across wide frequency ranges without increasing power consumption
2Adaptability or versatility
If delay lines with more delay stages are used to support wide duty cycle adjustment range, then duty cycle adjustment range increases, but chip area increases
Solution Approach 1:
The patent replaces physical delay lines that require multiple delay stages with a digital TDC-based measurement and control system. The TDC measures time intervals digitally and generates control signals accordingly, eliminating the need for extensive delay stage networks and reducing chip area while maintaining wide duty cycle adjustment range
Solution Approach 2:
The system transitions from spatial adjustment (multiple delay stages in sequence) to temporal measurement (time-to-digital conversion). By measuring the input period and calculating appropriate pulse widths in the digital domain, the system achieves wide adjustment range without proportionally increasing chip area
3Ease of operation
If conventional duty cycle adjustment mechanisms are used, then duty cycle can be adjusted, but noise generation increases
Solution Approach 1:
The patent replaces analog charge pump circuits that generate significant electromagnetic noise with a digital TDC-based system. The digital measurement and control approach minimizes noise generation while maintaining full duty cycle adjustability, making it suitable for sensitive digital circuits
4Area of stationary object
If circuit size scales down to improve area efficiency, then chip area decreases, but pulse generation reliability deteriorates
Solution Approach 1:
The patent employs a digital TDC-based pulse generation system that is inherently more scalable and reliable than analog mechanisms. The digital logic and time measurement approach maintains precision and reliability even as circuit dimensions scale down, overcoming the limitations of conventional analog pulse generation in scaled technologies
Data Source
AI summary
A duty cycle adjustment system includes a time-to-digital converter to generate a plurality of time-to-digital codes from an input signal, a duty cycle index generator to compute a duty cycle of the input signal based upon the plurality of time-to-digital codes, and assign a duty cycle index based upon the computed duty cycle, an input phase assignment generator to generate a first output and a second output based upon the duty cycle index, a first delay line to delay the first output to generate a third output, and a duty cycle generator to adjust the duty cycle of the input signal based upon the third output and the second output.


