Digital IQ Modulation Test Channels for Multi-Port Signal Testing
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Solution Overview
Problem
Current test apparatuses lack the capability to efficiently test devices with multiple I/O ports using digital multi-value modulation/demodulation methods, leading to difficulties in mass production due to hardware limitations and the need for real-time hardware-level testing.
Innovation Solution
A test apparatus equipped with digital modulators and demodulators that perform digital multi-value modulation and demodulation, featuring adjustable timing signals, multi-level drivers, and amplitude/quadrature components to accommodate various modulation formats and emulate IQ mismatches, allowing for real-time testing across multiple channels without increasing hardware scale.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional test apparatuses with single or several I/O ports are used, then the hardware scale is small and simple, but they cannot test devices with tens to hundreds of I/O ports simultaneously
Solution Approach 1:
The test apparatus divides the testing function into multiple independent channel units, where each channel can handle one or more I/O ports. This segmentation allows the system to scale from testing a single port to testing hundreds of ports by simply adding more channel units, rather than redesigning the entire system.
Solution Approach 2:
The test apparatus employs universal test channels that can be configured to handle different types of signals and port configurations. Each channel unit is designed to be multi-functional, capable of testing various I/O port types (serial, parallel, differential, etc.) through reconfiguration, thus allowing a single apparatus to test devices with diverse port requirements.
2Measurement precision
If signals are A/D converted and subjected to software processing, then signal analysis is thorough, but testing time becomes excessively long
Solution Approach 1:
The invention replaces software-based signal processing with dedicated hardware processing circuits. Instead of A/D converting signals and processing them through software algorithms, the system uses hardware logic circuits that directly process digital signals in real-time, eliminating the time-consuming A/D conversion and software processing steps while maintaining analysis accuracy.
Solution Approach 2:
The test apparatus performs preliminary signal conditioning and processing in the hardware domain before final measurement. By pre-processing signals through hardware circuits that are optimized for specific test scenarios, the system reduces the complexity and time required for subsequent analysis, enabling faster overall testing while maintaining precision.
3Ease of manufacture
If digital pins are provided assuming binary signal testing, then the digital pin configuration is simple, but they lack demodulation function for digitally modulated signals
Solution Approach 1:
The digital pins are designed with dynamic reconfiguration capability, allowing them to switch between different operating modes (binary testing, multi-value modulation/demodulation, differential signaling, etc.) based on the test requirements. This dynamic flexibility enables the same physical pin to perform multiple functions without requiring separate dedicated pins for each signal type.
Solution Approach 2:
The invention changes the operational parameters of the digital pins to support different signal types. By adjusting parameters such as voltage levels, timing characteristics, and logic states, the same digital pin infrastructure can handle binary signals, multi-value modulated signals, and differential signals, effectively providing demodulation functionality without hardware changes.
Data Source
AI summary
A test apparatus includes digital modulators provided in increments of multiple channels. A baseband signal generator performs retiming of data input as a modulation signal for the in-phase (quadrature) component, using a timing signal the timing of which can be adjusted, thereby generating a baseband signal. A driver generates a multi-value digital signal having a level that corresponds to the baseband signal output from the baseband signal generator. A multiplier amplitude-modulates a carrier signal with the multi-value digital signal. An adder sums the output signals of the multipliers.