Digital Temperature Detection Circuit for Semiconductor Devices
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Solution Overview
Problem
Conventional digital temperature detection circuits for semiconductor devices are inaccurate due to gaps between theoretical and actual threshold temperatures and non-linear response intervals, making it difficult to accurately read internal temperature changes.
Innovation Solution
A digital temperature detection circuit comprising a digital temperature detection block, an analog-to-digital converter, and a data converter that generates standard data with a predetermined response interval using first and second sample data, ensuring a monotonic voltage level variation with internal temperature, allowing for precise temperature detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional digital temperature detection circuits are used, then the device can detect temperature changes, but the measurement precision is poor due to gaps between theoretical and actual threshold temperatures
Solution Approach 1:
The patent implements a feedback mechanism where the detected temperature is compared with reference temperature values stored in a lookup table. The difference between the detected temperature and reference temperatures is used to generate correction values, which are then applied to adjust the final temperature reading. This feedback loop continuously refines the measurement accuracy by compensating for deviations from theoretical thresholds.
Solution Approach 2:
The patent changes the parameter representation from direct threshold comparisons to a normalized temperature scale based on reference temperatures. By storing reference temperatures and detected temperatures in a lookup table and calculating differences, the system transforms raw detection data into accurate temperature readings that account for manufacturing variations and environmental factors.
2Ease of operation
If conventional digital temperature detection circuits are used, then temperature detection is possible, but the response interval is non-linear making it difficult to interpret output changes
Solution Approach 1:
The patent transforms the non-linear response interval into a linear scale by using reference temperatures and calculated differences. The output is expressed as temperature differences from a reference point, creating a linear relationship where a constant change in temperature produces a constant change in output. This makes the output directly interpretable as temperature changes without requiring complex calibration or lookup tables during operation.
3Measurement precision
If a data conversion block with sample data is added, then measurement precision improves, but device complexity increases
Solution Approach 1:
The patent performs preliminary action by pre-storing reference temperature values and corresponding detection values in a lookup table during manufacturing or initialization. This pre-processing eliminates the need for complex real-time calculations during operation, as the system only needs to retrieve pre-computed values and calculate simple differences. The lookup table is generated beforehand using calibration data, reducing the computational burden during actual temperature detection.
Solution Approach 2:
The patent uses a simplified copying approach by creating a lookup table that copies reference temperature-detection value pairs from calibration data. Instead of implementing complex mathematical models or continuous calibration, the system copies discrete reference values and uses them to generate correction factors. This copying method reduces device complexity by replacing complex algorithms with simple table lookups and arithmetic operations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides a more accurate and user-friendly digital temperature detection system where a 1°C change in internal temperature corresponds to a consistent change in output data, enhancing the readability and reliability of temperature measurements.
Implementation Method 1
The temperature detector generates a temperature detection signal with a voltage level that varies monotonically in relation to an internal temperature of the semiconductor device
Data Source
AI summary
A digital temperature detection circuit for a semiconductor circuit comprises a digital temperature defection block and a data conversion block. The digital temperature detection block is adapted to detect an internal temperature of the semiconductor device and generate detection data having a data value that varies according to the detected internal temperature. The data conversion block is adapted to convert the detection data into standard data with a predetermined response interval using first and second sample data having respective data values that are determined by input from an external source.