Digital VFC Circuit for Accurate Failbit Counting

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Solution Overview

Problem

Existing VFC circuits in memory devices occupy space and increase power consumption, and their accuracy is affected by factors like power drop, transistor mismatch, and signal routing, leading to undercounting and yield loss.

Innovation Solution

A digital VFC circuit incorporating a counter circuit to count fail bits in unary format and a transcoder to transcode the result to binary format, eliminating reliance on current sensing and improving accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If analog method is used to sense failbit numbers, then the VFC circuit can be implemented with simpler structure, but current consumption increases and measurement precision deteriorates due to power drop, transistor mismatch, and signal routing issues

Engineering Contradiction:
ImproveVFC circuit structureVSAvoidfailbit count accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent replaces the analog current-based sensing system with a digital voltage-based counting system. Instead of using analog current sensing that is susceptible to power drop and transistor mismatch, the invention uses digital logic circuits (AND gates, OR gates, D flip-flops) to count failbits through voltage level detection, thereby eliminating the measurement precision issues while maintaining implementation simplicity

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the sensing parameter from current (analog) to voltage (digital). By detecting voltage levels rather than measuring current magnitudes, the system avoids the problems of power drop and transistor mismatch that affect current-based analog sensing, thus improving measurement precision without significantly increasing circuit complexity

Inventive Principle:
Principle #35Parameter changes

2Device complexity

If analog current sensing is used in VFC circuit, then the circuit implementation is straightforward, but power consumption increases due to continuous current flow requirements

Engineering Contradiction:
Improvecircuit implementationVSAvoidpower consumption
Core Design Contradiction:
Device complexityVSUse of energy by moving object

Solution Approach 1:

The patent implements periodic action by using clocked D flip-flops that update their state only at specific clock edges. The digital counting circuit operates in discrete time steps rather than continuously, allowing the circuit to consume power only during state transitions rather than maintaining continuous current flow, thus reducing overall power consumption while keeping implementation straightforward

Inventive Principle:
Principle #19Periodic action

3Measurement precision

If digital counter circuit is used to count failbits, then measurement precision improves, but device complexity increases due to additional logic gates and transcoders

Engineering Contradiction:
Improvefailbit count accuracyVSAvoidcircuit structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the digital counting function into modular components: individual AND gates for each memory string, OR gates for combining results, and D flip-flops for state storage. This segmentation allows each component to perform a simple, well-defined function, making the overall circuit easier to design and verify while achieving high measurement precision through the coordinated operation of these simple modules

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20250285692A1Digital verify failbit count (VFC) circuit
Publication Date: 2025.09.11 YANGTZE MEMORY TECH CO LTD
  • US20250285692A1 patent drawing
  • US20250285692A1 patent drawing
  • US20250285692A1 patent drawing

AI summary

A verify fail bit count (VFC) circuit includes a power-supply transistor, a sense stage coupled to the power-supply transistor and configured to, in response to a verification operation, sense each of a plurality of verification bits being a fail bit or a pass bit, a plurality of storage stages coupled to the sense stage in parallel and each configured to store one fail bit sensed by the sense stage based on a sequence from near to far from the sense stage, and a common ground transistor coupled to the sense stage and the plurality of storage stages.