Digitline Formation Using Composite Metal Nitride and Conductive Layers

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Solution Overview

Problem

Current memory array fabrication methods face challenges in efficiently forming digitlines that are uniform and have controlled critical dimensions, particularly when using carbon-containing walls, which can lead to increased resistance and complexity in forming airgaps and digitline formation.

Innovation Solution

The method involves forming a stack with vertically-alternating insulative and conductive tiers, using carbon-containing sacrificial walls to create void spaces for digitlines, where a conductive metal nitride is selectively deposited to form a lower portion of the digitlines, and a higher conductivity material is used to form an upper portion, allowing for better control over digitline uniformity and height.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If carbon-containing walls are used to form airgaps and digitlines, then airgap formation is simplified, but digitline resistance increases and manufacturing complexity increases

Engineering Contradiction:
Improveairgap formationVSAvoiddigitline resistance
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The digitline formation process is segmented into multiple deposition steps: first depositing conductive metal nitride in spaced openings and atop insulating material, then forming a separate upper conductive portion. This segmentation allows different materials and deposition conditions to be optimized independently, reducing overall resistance while maintaining the simplified airgap formation benefits of carbon-containing walls.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The digitline structure uses composite materials consisting of conductive metal nitride combined with additional conductive material deposited in subsequent steps. This composite approach leverages the low-resistance properties of the metal nitride while adding supplementary conductive layers to further reduce resistance, resolving the contradiction between ease of manufacture and electrical performance.

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If uniform digitline critical dimensions are required, then manufacturing precision improves, but process complexity and difficulty increase

Engineering Contradiction:
Improvedigitline critical dimensionsVSAvoiddigitline formation process
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

Carbon-containing sacrificial walls are formed in advance to define the precise geometry and critical dimensions of the future digitlines. These pre-formed walls serve as templates that guide subsequent material deposition, ensuring uniform digitline dimensions are achieved before the actual conductive materials are deposited, thereby simplifying the overall process while maintaining high precision.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The carbon-containing sacrificial walls act as an intermediary structure that temporarily holds the geometric information needed for uniform digitline formation. These walls mediate between the deposition process and the final digitline structure, allowing precise critical dimensions to be transferred without requiring complex real-time control during material deposition.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If more conductive metal nitride material is used to reduce resistance, then digitline conductivity improves, but material quantity and cost increase

Engineering Contradiction:
Improvedigitline conductivityVSAvoidconductive metal nitride material
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

Instead of using large quantities of conductive metal nitride alone, the invention employs composite digitline structures where conductive metal nitride is combined with additional conductive materials deposited in subsequent processing steps. This composite approach achieves superior overall conductivity while using less conductive metal nitride material, as the additional conductive layers contribute to the total conductive cross-section.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The solution adds a vertical dimension to the digitline structure by forming multi-layered conductive stacks rather than relying solely on increasing the lateral dimensions or thickness of a single conductive metal nitride layer. This dimensional transition allows conductivity to be enhanced through the accumulation of multiple thin conductive layers, reducing the total material quantity needed while maintaining or improving overall conductivity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces the quantity of less-conductive conductive metal nitride material needed, improves digitline uniformity, and simplifies the formation of airgaps, leading to more efficient and reliable memory array construction.

Implementation Method 1

a conductive metal nitride is selectively deposited in the void space, in the spaced openings

Methodology Applied
Scientific EffectPhysical Vapour Deposition: Physical Vapour Deposition

Data Source

PatentUS20240381638A1Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory Cells
Publication Date: 2024.11.14 MICRON TECHNOLOGY INC
  • US20240381638A1 patent drawing
  • US20240381638A1 patent drawing
  • US20240381638A1 patent drawing

AI summary

A method used in forming a memory array comprising strings of memory cells comprises forming a stack comprising vertically-alternating insulative tiers and conductive tiers having channel-material strings therein. Walls are formed above insulating material that is directly above the channel-material strings. Void space is laterally-between immediately-adjacent of the walls and that comprises a longitudinal outline of individual digitlines to be formed. Spaced openings are in the insulating material directly below the void space. Relative to the walls, a conductive metal nitride is selectively deposited in the void space, in the spaced openings, and atop the insulating material laterally-between the walls and the spaced openings to form a lower portion of the individual digitlines laterally-between the immediately-adjacent walls. The conductive metal nitride that is in individual of the spaced openings is directly electrically coupled to individual of the channel-material strings. A conductive material is formed in the void space directly above and directly electrically coupled to the lower portion of the individual digitlines to form an upper portion thereof. Other embodiments, including structure independent of method, are disclosed.